Inventor
KU KIE BONG
KR46 patents
⚠️ This page may combine multiple inventors who share the name “KU KIE BONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SK HYNIX INC
18 patentsUS8811100B2Aug 19, 2014
Cell array and memory device including the same
SK HYNIX INC84 citations98
US10037291B2Jul 31, 2018
Semiconductor memory apparatus and data input/output method thereof
SK HYNIX INC2 citations73
US9287855B2Mar 15, 2016
Semiconductor device and semiconductor system including the same
SK HYNIX INC3 citations73
US9231580B2Jan 5, 2016
Semicondutor apparatus for controlling back bias
SK HYNIX INC6 citations73
US8824228B2Sep 2, 2014
Integrated circuit chip and memory device
SK HYNIX INC4 citations73
US9275700B2Mar 1, 2016
Semiconductor device
SK HYNIX INC3 citations72
US9448866B2Sep 20, 2016
Monitoring device of integrated circuit
SK HYNIX INC1 citations63
US9070428B2Jun 30, 2015
Semiconductor device
SK HYNIX INC3 citations62
US9450587B2Sep 20, 2016
Test circuit and test method of semiconductor apparatus
SK HYNIX INC2 citations61
US10409741B2Sep 10, 2019
Semiconductor memory apparatus and data input/output method thereof
SK HYNIX INC0 citations52
US9524760B2Dec 20, 2016
Data output circuit
SK HYNIX INC0 citations52
US9489992B2Nov 8, 2016
Semiconductor device and semiconductor system including the same
SK HYNIX INC0 citations52
US9401224B2Jul 26, 2016
Monitoring device of integrated circuit
SK HYNIX INC0 citations52
US9396079B2Jul 19, 2016
Semiconductor memory device and semiconductor system including the same
SK HYNIX INC1 citations52
US9324400B2Apr 26, 2016
Semiconductor memory device and semiconductor memory system
SK HYNIX INC1 citations52
US9013931B2Apr 21, 2015
Semiconductor memory device and method for testing the same
SK HYNIX INC0 citations52
US9285414B2Mar 15, 2016
Method and system for testing semiconductor device
SK HYNIX INC0 citations47
US9274162B2Mar 1, 2016
Method and system for testing semiconductor device
SK HYNIX INC0 citations47
HYNIX SEMICONDUCTOR INC
10 patentsUS7463534B2Dec 9, 2008
Write apparatus for DDR SDRAM semiconductor memory device
HYNIX SEMICONDUCTOR INC44 citations92
US7671646B2Mar 2, 2010
Delay locked loop
HYNIX SEMICONDUCTOR INC9 citations84
US7548100B2Jun 16, 2009
Delay locked loop
HYNIX SEMICONDUCTOR INC8 citations84
US6920068B2Jul 19, 2005
Semiconductor memory device with modified global input/output scheme
HYNIX SEMICONDUCTOR INC8 citations74
US7916562B2Mar 29, 2011
Clock driver device and semiconductor memory apparatus having the same
HYNIX SEMICONDUCTOR INC4 citations63
US7679969B2Mar 16, 2010
Semiconductor memory device utilizing data mask signal for sharing an input/output channel in a test mode and data output method using the same
HYNIX SEMICONDUCTOR INC3 citations63
US7626873B2Dec 1, 2009
Semiconductor memory apparatus, semiconductor integrated circuit having the same, and method of outputting data in semiconductor memory apparatus
HYNIX SEMICONDUCTOR INC5 citations63
US6519199B2Feb 11, 2003
Semiconductor memory device
HYNIX SEMICONDUCTOR INC6 citations63
US8027210B2Sep 27, 2011
Data input apparatus with improved setup/hold window
HYNIX SEMICONDUCTOR INC0 citations52
US7855570B2Dec 21, 2010
Semiconductor device for performing mount test in response to internal test mode signals
HYNIX SEMICONDUCTOR INC0 citations52
HYUNDAI ELECTRONICS IND
9 patentsUS6396322B1May 28, 2002
Delay locked loop of a DDR SDRAM
HYUNDAI ELECTRONICS IND92 citations98
US6141273AOct 31, 2000
Circuit for setting width of input/output data in semiconductor memory device
HYUNDAI ELECTRONICS IND61 citations96
US6255895B1Jul 3, 2001
Circuit for generating a reference voltage trimmed by an anti-fuse programming
HYUNDAI ELECTRONICS IND22 citations93
US6150868ANov 21, 2000
Anti-fuse programming circuit
HYUNDAI ELECTRONICS IND41 citations93
US6144247ANov 7, 2000
Anti-fuse programming circuit using variable voltage generator
HYUNDAI ELECTRONICS IND20 citations93
US6108261AAug 22, 2000
Repair circuit for redundancy circuit with anti-fuse
HYUNDAI ELECTRONICS IND30 citations93
US6133778AOct 17, 2000
Anti-fuse programming circuit with cross-coupled feedback loop
HYUNDAI ELECTRONICS IND19 citations84
US6356501B2Mar 12, 2002
Apparatus for generating high voltage signal
HYUNDAI ELECTRONICS IND15 citations81
US6323720B1Nov 27, 2001
Internal voltage generator using anti-fuse
HYUNDAI ELECTRONICS IND6 citations63
KU KIE-BONG
4 patentsUS9104571B2Aug 11, 2015
Monitoring device of integrated circuit
KU KIE-BONG10 citations84
US8817573B2Aug 26, 2014
Semiconductor memory device including mode register set and method for operating the same
KU KIE-BONG3 citations62
US8243533B2Aug 14, 2012
Semiconductor memory device and method of operating the same
KU KIE-BONG3 citations62
US8922235B2Dec 30, 2014
Method and system for testing semiconductor device
KU KIE-BONG1 citations57
KU KIE BONG
4 patentsUS8237486B2Aug 7, 2012
Clock control circuit and semiconductor memory apparatus using the same
KU KIE BONG9 citations84
US8456937B2Jun 4, 2013
Semiconductor integrated circuit
KU KIE BONG5 citations73
US8520462B2Aug 27, 2013
Semiconductor memory apparatus
KU KIE BONG0 citations52
US8437212B2May 7, 2013
Semiconductor memory apparatus, memory system, and programming method thereof
KU KIE BONG0 citations52