Inventor
GILTON TERRY
US24 patents
⚠️ This page may combine multiple inventors who share the name “GILTON TERRY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
18 patentsUS6281131B1Aug 28, 2001
Methods of forming electrical contacts
MICRON TECHNOLOGY INC63 citations94
US6379981B2Apr 30, 2002
Methods incorporating detectable atoms into etching processes
MICRON TECHNOLOGY INC14 citations92
US6344364B1Feb 5, 2002
Etching methods
MICRON TECHNOLOGY INC14 citations92
US6320246B1Nov 20, 2001
Semiconductor wafer assemblies
MICRON TECHNOLOGY INC21 citations92
US6143611ANov 7, 2000
Semiconductor processing methods, methods of forming electronic components, and transistors
MICRON TECHNOLOGY INC30 citations92
US6660180B2Dec 9, 2003
Compositions for etching silicon with high selectivity to oxides and methods of using same
MICRON TECHNOLOGY INC18 citations91
US6391793B2May 21, 2002
Compositions for etching silicon with high selectivity to oxides and methods of using same
MICRON TECHNOLOGY INC40 citations91
US6602785B1Aug 5, 2003
Method of forming a conductive contact on a substrate and method of processing a semiconductor substrate using an ozone treatment
MICRON TECHNOLOGY INC15 citations84
US5188723AFeb 23, 1993
Selective electro-deposition and circuit patterning technique
MICRON TECHNOLOGY INC20 citations82
US6838365B2Jan 4, 2005
Methods of forming electronic components, and a conductive line
MICRON TECHNOLOGY INC4 citations73
US6576939B1Jun 10, 2003
Semiconductor processing methods, methods of forming electronic components, and transistors
MICRON TECHNOLOGY INC8 citations73
US6090707AJul 18, 2000
Method of forming a conductive silicide layer on a silicon comprising substrate and method of forming a conductive silicide contact
MICRON TECHNOLOGY INC3 citations63
US7777287B2Aug 17, 2010
System and apparatus providing analytical device based on solid state image sensor
MICRON TECHNOLOGY INC1 citations62
US6593759B2Jul 15, 2003
Apparatuses and methods for determining if protective coatings on semiconductor substrate holding devices have been compromised
MICRON TECHNOLOGY INC3 citations62
US6411110B1Jun 25, 2002
Apparatuses and methods for determining if protective coatings on semiconductor substrate holding devices have been compromised
MICRON TECHNOLOGY INC5 citations62
US6472328B2Oct 29, 2002
Methods of forming an electrical contact to semiconductive material
MICRON TECHNOLOGY INC3 citations61
US6056615AMay 2, 2000
Wet chemical emitter tip treatment
MICRON TECHNOLOGY INC0 citations52
US6713355B2Mar 30, 2004
Semiconductor processing method
MICRON TECHNOLOGY INC0 citations51
SEMICONDUCTOR COMPONENTS IND LLC
2 patentsGILTON TERRY
2 patentsUS8609452B2Dec 17, 2013
Method and apparatus providing analytical device and operating method based on solid state image sensor
GILTON TERRY0 citations47
US8207588B2Jun 26, 2012
Method and apparatus providing analytical device and operating method based on solid state image sensor
GILTON TERRY0 citations47