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Inventor
LIU MINXUAN
US
2 patents
Patents
2 patents
US7379281B2
May 27, 2008
Bias for electrostatic discharge protection
LSI LOGIC CORP
1 citations
46
US7190185B2
Mar 13, 2007
Methodology to measure many more transistors on the same test area
LSI LOGIC CORP
0 citations
43