P

Inventor

KARP JAMES

US63 patents
⚠️ This page may combine multiple inventors who share the name “KARP JAMES”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

XILINX INC

33 patents
US7919845B2Apr 5, 2011

Formation of a hybrid integrated circuit device

XILINX INC188 citations98
US6266269B1Jul 24, 2001

Three terminal non-volatile memory element

XILINX INC113 citations98
US6044012AMar 28, 2000

Non-volatile memory array using gate breakdown structure in standard sub 0.35 micron CMOS process

XILINX INC81 citations96
US11398469B1Jul 26, 2022

Electrostatic discharge (ESD) protection in stacked chips

XILINX INC22 citations94
US10015916B1Jul 3, 2018

Removal of electrostatic charges from an interposer via a ground pad thereof for die attach for formation of a stacked die

XILINX INC45 citations94
US9013845B1Apr 21, 2015

High voltage RC-clamp for electrostatic discharge (ESD) protection

XILINX INC40 citations94
US9575111B1Feb 21, 2017

On chip detection of electrical overstress events

XILINX INC20 citations92
US6549458B1Apr 15, 2003

Non-volatile memory array using gate breakdown structures

XILINX INC25 citations92
US6522582B1Feb 18, 2003

Non-volatile memory array using gate breakdown structures

XILINX INC20 citations92
US10497677B1Dec 3, 2019

ESD protection in a stacked integrated circuit assembly

XILINX INC7 citations84
US9607948B2Mar 28, 2017

Method and circuits for communication in multi-die packages

XILINX INC8 citations84
US7812674B2Oct 12, 2010

Common centroid electrostatic discharge protection for integrated circuit devices

XILINX INC12 citations84
US7544968B1Jun 9, 2009

Non-volatile memory cell with charge storage element and method of programming

XILINX INC8 citations84
US11043484B1Jun 22, 2021

Method and apparatus of package enabled ESD protection

XILINX INC8 citations83
US9484919B1Nov 1, 2016

Selection of logic paths for redundancy

XILINX INC7 citations83
US10289178B1May 14, 2019

Configurable single event latch-up (SEL) and electrical overvoltage stress (EOS) detection circuit

XILINX INC11 citations82
US7002219B1Feb 21, 2006

Electrical fuse for integrated circuits

XILINX INC18 citations81
US9462674B1Oct 4, 2016

Circuits for and methods of providing a charge device model ground path using substrate taps in an integrated circuit device

XILINX INC8 citations80
US6638852B1Oct 28, 2003

Structure and method for preventing barrier failure

XILINX INC6 citations74
US6316132B1Nov 13, 2001

Structure and method for preventing barrier failure

XILINX INC6 citations74
US11508667B1Nov 22, 2022

Embedded shield for protection of memory cells

XILINX INC2 citations73
US11177654B1Nov 16, 2021

Electro-static discharge (ESD) damage self-test

XILINX INC2 citations73
US10522531B1Dec 31, 2019

Integrated circuit device and method of transmitting data in an integrated circuit device

XILINX INC2 citations73
US9483599B1Nov 1, 2016

Circuit design-specific failure in time rate for single event upsets

XILINX INC6 citations73
US9013844B2Apr 21, 2015

Circuit for and method of enabling the discharge of electric charge in an integrated circuit

XILINX INC4 citations73
US6740936B1May 25, 2004

Ballast resistor with reduced area for ESD protection

XILINX INC12 citations73
US10325901B1Jun 18, 2019

Circuit for increasing the impedance of an ESD path in an input/output circuit and method of implementing the same

XILINX INC2 citations72
US11114429B2Sep 7, 2021

Integrated circuit device with electrostatic discharge (ESD) protection

XILINX INC1 citations63
US10901097B1Jan 26, 2021

Method and apparatus for electronics-harmful-radiation (EHR) measurement and monitoring

XILINX INC1 citations63
US9275180B1Mar 1, 2016

Programmable integrated circuit having different types of configuration memory

XILINX INC2 citations63
US9236353B2Jan 12, 2016

Integrated circuit having improved radiation immunity

XILINX INC2 citations63
US6432808B1Aug 13, 2002

Method of improved bondability when using fluorinated silicon glass

XILINX INC2 citations63
US9000529B1Apr 7, 2015

Reduction of single event upsets within a semiconductor integrated circuit

XILINX INC3 citations62

KARP JAMES

8 patents

KIREEV VASSILI

3 patents

HART MICHAEL J

2 patents

JENKINS MICHAEL O

1 patent

LI RICHARD C

1 patent

FAKHRUDDIN MOHAMMED

1 patent

LO KUOK-KHIAN

1 patent

Showing the top 50 of 63 patents by PatentIndex Score.