Inventor
NOTTE IV JOHN A
US43 patents
⚠️ This page may combine multiple inventors who share the name “NOTTE IV JOHN A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ALIS CORP
18 patentsUS7786452B2Aug 31, 2010
Ion sources, systems and methods
ALIS CORP61 citations98
US7557358B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP69 citations98
US7557359B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP71 citations98
US7557361B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP67 citations98
US7554096B2Jun 30, 2009
Ion sources, systems and methods
ALIS CORP100 citations98
US7554097B2Jun 30, 2009
Ion sources, systems and methods
ALIS CORP74 citations98
US7557360B2Jul 7, 2009
Ion sources, systems and methods
ALIS CORP67 citations97
US7786451B2Aug 31, 2010
Ion sources, systems and methods
ALIS CORP58 citations96
US7521693B2Apr 21, 2009
Ion sources, systems and methods
ALIS CORP23 citations92
US7518122B2Apr 14, 2009
Ion sources, systems and methods
ALIS CORP19 citations92
US7511280B2Mar 31, 2009
Ion sources, systems and methods
ALIS CORP26 citations92
US7511279B2Mar 31, 2009
Ion sources, systems and methods
ALIS CORP29 citations92
US7504639B2Mar 17, 2009
Ion sources, systems and methods
ALIS CORP24 citations92
US7495232B2Feb 24, 2009
Ion sources, systems and methods
ALIS CORP20 citations92
US7488952B2Feb 10, 2009
Ion sources, systems and methods
ALIS CORP20 citations92
US7485873B2Feb 3, 2009
Ion sources, systems and methods
ALIS CORP36 citations92
US7804068B2Sep 28, 2010
Determining dopant information
ALIS CORP15 citations84
US7601953B2Oct 13, 2009
Systems and methods for a gas field ion microscope
ALIS CORP16 citations84
CARL ZEISS MICROSCOPY LLC
12 patentsUS9236225B2Jan 12, 2016
Ion sources, systems and methods
CARL ZEISS MICROSCOPY LLC4 citations83
US9218935B2Dec 22, 2015
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC5 citations82
US9218934B2Dec 22, 2015
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC5 citations82
US9640364B2May 2, 2017
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC2 citations71
US9012867B2Apr 21, 2015
Ion sources, systems and methods
CARL ZEISS MICROSCOPY LLC1 citations61
US10410828B2Sep 10, 2019
Charged particle beam system and methods
CARL ZEISS MICROSCOPY LLC1 citations54
US9627172B2Apr 18, 2017
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations50
US9536699B2Jan 3, 2017
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations50
US9029765B2May 12, 2015
Ion sources, systems and methods
CARL ZEISS MICROSCOPY LLC0 citations50
US9530611B2Dec 27, 2016
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations48
US9530612B2Dec 27, 2016
Charged particle beam system and method of operating a charged particle beam system
CARL ZEISS MICROSCOPY LLC0 citations48
US10037862B2Jul 31, 2018
Charged particle detecting device and charged particle beam system with same
CARL ZEISS MICROSCOPY LLC0 citations38
NOTTE IV JOHN A
4 patentsUS8227753B2Jul 24, 2012
Multiple current charged particle methods
NOTTE IV JOHN A6 citations72
US8124941B2Feb 28, 2012
Increasing current in charged particle sources and systems
NOTTE IV JOHN A2 citations53
US8648299B2Feb 11, 2014
Isotope ion microscope methods and systems
NOTTE IV JOHN A0 citations46
US8314403B2Nov 20, 2012
Gas field ion source with coated tip
NOTTE IV JOHN A0 citations40