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Inventor

LEE YONG MENG

US37 patents
⚠️ This page may combine multiple inventors who share the name “LEE YONG MENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHARTERED SEMICONDUCTOR MFG

15 patents
US6025267AFeb 15, 2000

Silicon nitride--TEOS oxide, salicide blocking layer for deep sub-micron devices

CHARTERED SEMICONDUCTOR MFG140 citations98
US7445978B2Nov 4, 2008

Method to remove spacer after salicidation to enhance contact etch stop liner stress on MOS

CHARTERED SEMICONDUCTOR MFG22 citations92
US6927104B2Aug 9, 2005

Method of forming double-gated silicon-on-insulator (SOI) transistors with corner rounding

CHARTERED SEMICONDUCTOR MFG32 citations92
US6258648B1Jul 10, 2001

Selective salicide process by reformation of silicon nitride sidewall spacers

CHARTERED SEMICONDUCTOR MFG19 citations92
US6835609B1Dec 28, 2004

Method of forming double-gate semiconductor-on-insulator (SOI) transistors

CHARTERED SEMICONDUCTOR MFG31 citations91
US6372569B1Apr 16, 2002

Selective formation of hydrogen rich PECVD silicon nitride for improved NMOS transistor performance

CHARTERED SEMICONDUCTOR MFG47 citations91
US7309637B2Dec 18, 2007

Method to enhance device performance with selective stress relief

CHARTERED SEMICONDUCTOR MFG14 citations84
US6787404B1Sep 7, 2004

Method of forming double-gated silicon-on-insulator (SOI) transistors with reduced gate to source-drain overlap capacitance

CHARTERED SEMICONDUCTOR MFG15 citations84
US7256084B2Aug 14, 2007

Composite stress spacer

CHARTERED SEMICONDUCTOR MFG12 citations83
US6583011B1Jun 24, 2003

Method for forming damascene dual gate for improved oxide uniformity and control

CHARTERED SEMICONDUCTOR MFG15 citations82
US7659174B2Feb 9, 2010

Method to enhance device performance with selective stress relief

CHARTERED SEMICONDUCTOR MFG6 citations74
US6436754B1Aug 20, 2002

Selective salicide process by reformation of silicon nitride sidewall spacers

CHARTERED SEMICONDUCTOR MFG7 citations74
US7141854B2Nov 28, 2006

Double-gated silicon-on-insulator (SOI) transistors with corner rounding

CHARTERED SEMICONDUCTOR MFG7 citations73
US6107140AAug 22, 2000

Method of patterning gate electrode conductor with ultra-thin gate oxide

CHARTERED SEMICONDUCTOR MFG13 citations72
US7615427B2Nov 10, 2009

Spacer-less low-k dielectric processes

CHARTERED SEMICONDUCTOR MFG3 citations62

GLOBALFOUNDRIES INC

6 patents

IBM

4 patents

POET TECH INC

3 patents

GLOBALFOUNDRIES SG PTE LTD

3 patents

TEO LEE WEE

2 patents

INFINEON TECHNOLOGIES AG

1 patent

LEE YONG MENG

1 patent

CHEN XIANGDONG

1 patent

PARK JAE-EUN

1 patent