P

Inventor

TOMODA TOSHIMASA

JP18 patents
⚠️ This page may combine multiple inventors who share the name “TOMODA TOSHIMASA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

16 patents
US5289260AFeb 22, 1994

Pattern defect detection device and a spatial frequency filter used therein

MITSUBISHI ELECTRIC CORP25 citations92
US5864374AJan 26, 1999

Method and apparatus for image generation

MITSUBISHI ELECTRIC CORP42 citations91
US6337724B1Jan 8, 2002

Image display system

MITSUBISHI ELECTRIC CORP35 citations90
US4841489AJun 20, 1989

Method of imaging an object by ultrasonic or electromagnetic waves

MITSUBISHI ELECTRIC CORP37 citations90
US5379150AJan 3, 1995

Method of manufacturing a spatial frequency filter for use in a pattern defect detection device

MITSUBISHI ELECTRIC CORP13 citations73
US5170063ADec 8, 1992

Inspection device for detecting defects in a periodic pattern on a semiconductor wafer

MITSUBISHI ELECTRIC CORP15 citations73
US5030842AJul 9, 1991

Fine-particle measuring apparatus

MITSUBISHI ELECTRIC CORP12 citations73
US5008558AApr 16, 1991

System for detecting minute particles on or above a substrate

MITSUBISHI ELECTRIC CORP10 citations73
US4410483AOct 18, 1983

Neutron detector for use within nuclear reactor

MITSUBISHI ELECTRIC CORP8 citations73
US5305366AApr 19, 1994

Thin film forming apparatus

MITSUBISHI ELECTRIC CORP9 citations72
US4885759ADec 5, 1989

Measurement apparatus employing radiation

MITSUBISHI ELECTRIC CORP17 citations70
US4379248AApr 5, 1983

Ionization chamber having coaxially arranged cylindrical electrodes

MITSUBISHI ELECTRIC CORP8 citations70
US4587429AMay 6, 1986

Methods of improving radiation resistant characteristic of BF3 proportional counters

MITSUBISHI ELECTRIC CORP4 citations61
US4302696ANov 24, 1981

Gamma-ray compensated ionization chamber

MITSUBISHI ELECTRIC CORP6 citations60
US4817122AMar 28, 1989

Apparatus for radiation analysis

MITSUBISHI ELECTRIC CORP6 citations59
US4785409ANov 15, 1988

System for making standard deviations in quantum noise constant throughout a screen display

MITSUBISHI ELECTRIC CORP1 citations51

PETRO CANADA INC

1 patent

JAPAN ATOMIC ENERGY RES INST

1 patent