Inventor
TOMODA TOSHIMASA
JP18 patents
⚠️ This page may combine multiple inventors who share the name “TOMODA TOSHIMASA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
16 patentsUS5289260AFeb 22, 1994
Pattern defect detection device and a spatial frequency filter used therein
MITSUBISHI ELECTRIC CORP25 citations92
US5864374AJan 26, 1999
Method and apparatus for image generation
MITSUBISHI ELECTRIC CORP42 citations91
US6337724B1Jan 8, 2002
Image display system
MITSUBISHI ELECTRIC CORP35 citations90
US4841489AJun 20, 1989
Method of imaging an object by ultrasonic or electromagnetic waves
MITSUBISHI ELECTRIC CORP37 citations90
US5379150AJan 3, 1995
Method of manufacturing a spatial frequency filter for use in a pattern defect detection device
MITSUBISHI ELECTRIC CORP13 citations73
US5170063ADec 8, 1992
Inspection device for detecting defects in a periodic pattern on a semiconductor wafer
MITSUBISHI ELECTRIC CORP15 citations73
US5030842AJul 9, 1991
Fine-particle measuring apparatus
MITSUBISHI ELECTRIC CORP12 citations73
US5008558AApr 16, 1991
System for detecting minute particles on or above a substrate
MITSUBISHI ELECTRIC CORP10 citations73
US4410483AOct 18, 1983
Neutron detector for use within nuclear reactor
MITSUBISHI ELECTRIC CORP8 citations73
US5305366AApr 19, 1994
Thin film forming apparatus
MITSUBISHI ELECTRIC CORP9 citations72
US4885759ADec 5, 1989
Measurement apparatus employing radiation
MITSUBISHI ELECTRIC CORP17 citations70
US4379248AApr 5, 1983
Ionization chamber having coaxially arranged cylindrical electrodes
MITSUBISHI ELECTRIC CORP8 citations70
US4587429AMay 6, 1986
Methods of improving radiation resistant characteristic of BF3 proportional counters
MITSUBISHI ELECTRIC CORP4 citations61
US4302696ANov 24, 1981
Gamma-ray compensated ionization chamber
MITSUBISHI ELECTRIC CORP6 citations60
US4817122AMar 28, 1989
Apparatus for radiation analysis
MITSUBISHI ELECTRIC CORP6 citations59
US4785409ANov 15, 1988
System for making standard deviations in quantum noise constant throughout a screen display
MITSUBISHI ELECTRIC CORP1 citations51