Inventor
LEE KUEN-JONG
TW11 patents
⚠️ This page may combine multiple inventors who share the name “LEE KUEN-JONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNIV NAT CHENG KUNG
5 patentsUS9448122B2Sep 20, 2016
Multi-point temperature sensing method for integrated circuit chip and system of the same
UNIV NAT CHENG KUNG2 citations61
US9857240B2Jan 2, 2018
System and method for temperature sensing of three-dimensional integrated circuit
UNIV NAT CHENG KUNG0 citations51
US8892973B2Nov 18, 2014
Debugging control system using inside core event as trigger condition and method of the same
UNIV NAT CHENG KUNG0 citations41
US10324129B2Jun 18, 2019
Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains
UNIV NAT CHENG KUNG0 citations30
US10324130B2Jun 18, 2019
Test decompressor and test method thereof
UNIV NAT CHENG KUNG0 citations30
NAT SCIENCE COUNCIL
4 patentsUS6360342B1Mar 19, 2002
Built-in self test for multiple memories in a chip
NAT SCIENCE COUNCIL39 citations84
US5808476ASep 15, 1998
Built-in current sensor for IDDQ monitoring
NAT SCIENCE COUNCIL13 citations68
US5631575AMay 20, 1997
Intermediate voltage sensor for CMOS circuits
NAT SCIENCE COUNCIL13 citations68
US7159161B2Jan 2, 2007
Test method and architecture for circuits having inputs
NAT SCIENCE COUNCIL9 citations63