Inventor
LUNING SCOTT D
US43 patents
⚠️ This page may combine multiple inventors who share the name “LUNING SCOTT D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANCED MICRO DEVICES INC
36 patentsUS5705430AJan 6, 1998
Dual damascene with a sacrificial via fill
ADVANCED MICRO DEVICES INC173 citations99
US5614765AMar 25, 1997
Self aligned via dual damascene
ADVANCED MICRO DEVICES INC172 citations99
US5795823AAug 18, 1998
Self aligned via dual damascene
ADVANCED MICRO DEVICES INC114 citations98
US6506642B1Jan 14, 2003
Removable spacer technique
ADVANCED MICRO DEVICES INC74 citations96
US5691238ANov 25, 1997
Subtractive dual damascene
ADVANCED MICRO DEVICES INC68 citations96
US5686354ANov 11, 1997
Dual damascene with a protective mask for via etching
ADVANCED MICRO DEVICES INC80 citations96
US5989963ANov 23, 1999
Method for obtaining a steep retrograde channel profile
ADVANCED MICRO DEVICES INC145 citations95
US6787464B1Sep 7, 2004
Method of forming silicide layers over a plurality of semiconductor devices
ADVANCED MICRO DEVICES INC32 citations93
US6589847B1Jul 8, 2003
Tilted counter-doped implant to sharpen halo profile
ADVANCED MICRO DEVICES INC47 citations93
US6372587B1Apr 16, 2002
Angled halo implant tailoring using implant mask
ADVANCED MICRO DEVICES INC39 citations93
US7241700B1Jul 10, 2007
Methods for post offset spacer clean for improved selective epitaxy silicon growth
ADVANCED MICRO DEVICES INC22 citations92
US6329257B1Dec 11, 2001
Method for laterally peaked source doping profiles for better erase control in flash memory devices
ADVANCED MICRO DEVICES INC19 citations92
US6005279ADec 21, 1999
Trench edge spacer formation
ADVANCED MICRO DEVICES INC30 citations92
US5888867AMar 30, 1999
Non-uniform threshold voltage adjustment in flash eproms through gate work function alteration
ADVANCED MICRO DEVICES INC49 citations92
US6051882AApr 18, 2000
Subtractive dual damascene semiconductor device
ADVANCED MICRO DEVICES INC17 citations90
US6391751B1May 21, 2002
Method for forming vertical profile of polysilicon gate electrodes
ADVANCED MICRO DEVICES INC23 citations89
US7553732B1Jun 30, 2009
Integration scheme for constrained SEG growth on poly during raised S/D processing
ADVANCED MICRO DEVICES INC13 citations84
US7402485B1Jul 22, 2008
Method of forming a semiconductor device
ADVANCED MICRO DEVICES INC9 citations84
US6168637B1Jan 2, 2001
Use of a large angle implant and current structure for eliminating a critical mask in flash memory processing
ADVANCED MICRO DEVICES INC15 citations84
US6015736AJan 18, 2000
Method and system for gate stack reoxidation control
ADVANCED MICRO DEVICES INC16 citations84
US7442601B2Oct 28, 2008
Stress enhanced CMOS circuits and methods for their fabrication
ADVANCED MICRO DEVICES INC10 citations83
US6743685B1Jun 1, 2004
Semiconductor device and method for lowering miller capacitance for high-speed microprocessors
ADVANCED MICRO DEVICES INC16 citations83
US7572705B1Aug 11, 2009
Semiconductor device and method of manufacturing a semiconductor device
ADVANCED MICRO DEVICES INC6 citations74
US6777281B1Aug 17, 2004
Maintaining LDD series resistance of MOS transistors by retarding dopant segregation
ADVANCED MICRO DEVICES INC9 citations74
US6127222AOct 3, 2000
Non-self-aligned side channel implants for flash memory cells
ADVANCED MICRO DEVICES INC7 citations74
US6025240AFeb 15, 2000
Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices
ADVANCED MICRO DEVICES INC12 citations74
US6727558B1Apr 27, 2004
Channel isolation using dielectric isolation structures
ADVANCED MICRO DEVICES INC9 citations73
US6624035B1Sep 23, 2003
Method of forming a hard mask for halo implants
ADVANCED MICRO DEVICES INC9 citations73
US6569606B1May 27, 2003
Method of reducing photoresist shadowing during angled implants
ADVANCED MICRO DEVICES INC10 citations70
US6294433B1Sep 25, 2001
Gate re-masking for deeper source/drain co-implantation processes
ADVANCED MICRO DEVICES INC3 citations63
US6617219B1Sep 9, 2003
Semiconductor device and method for lowering miller capacitance by modifying source/drain extensions for high speed microprocessors
ADVANCED MICRO DEVICES INC4 citations62
US6387755B1May 14, 2002
Method and system for providing localized gate edge rounding with minimal encroachment and gate edge lifting
ADVANCED MICRO DEVICES INC4 citations62
US6236596B1May 22, 2001
Biasing method and structure for reducing band-to-band and/or avalanche currents during the erase of flash memory devices
ADVANCED MICRO DEVICES INC6 citations60
US6410956B1Jun 25, 2002
Method and system for using a spacer to offset implant damage and reduce lateral diffusion in flash memory devices
ADVANCED MICRO DEVICES INC1 citations52
US6153487ANov 28, 2000
Approach for the formation of semiconductor devices which reduces band-to-band tunneling current and short-channel effects
ADVANCED MICRO DEVICES INC0 citations52
US7087509B1Aug 8, 2006
Method of forming a gate electrode on a semiconductor device and a device incorporating same
ADVANCED MICRO DEVICES INC0 citations50
GLOBALFOUNDRIES INC
4 patentsUS7910996B2Mar 22, 2011
Semiconductor device and method of manufacturing a semiconductor device
GLOBALFOUNDRIES INC7 citations84
US10186524B2Jan 22, 2019
Fully depleted silicon-on-insulator (FDSOI) transistor device and self-aligned active area in FDSOI bulk exposed regions
GLOBALFOUNDRIES INC0 citations50
US9941301B1Apr 10, 2018
Fully depleted silicon-on-insulator (FDSOI) transistor device and self-aligned active area in FDSOI bulk exposed regions
GLOBALFOUNDRIES INC0 citations50
US10181522B2Jan 15, 2019
Simplified gate to source/drain region connections
GLOBALFOUNDRIES INC0 citations49