P

Inventor

HUDSON GUY F

US43 patents
⚠️ This page may combine multiple inventors who share the name “HUDSON GUY F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

41 patents
US6200901B1Mar 13, 2001

Polishing polymer surfaces on non-porous CMP pads

MICRON TECHNOLOGY INC177 citations99
US5972792AOct 26, 1999

Method for chemical-mechanical planarization of a substrate on a fixed-abrasive polishing pad

MICRON TECHNOLOGY INC267 citations99
US5830806ANov 3, 1998

Wafer backing member for mechanical and chemical-mechanical planarization of substrates

MICRON TECHNOLOGY INC157 citations99
US6103636AAug 15, 2000

Method and apparatus for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC122 citations98
US6057602AMay 2, 2000

Low friction polish-stop stratum for endpointing chemical-mechanical planarization processing of semiconductor wafers

MICRON TECHNOLOGY INC98 citations98
US5976000ANov 2, 1999

Polishing pad with incompressible, highly soluble particles for chemical-mechanical planarization of semiconductor wafers

MICRON TECHNOLOGY INC144 citations98
US5679169AOct 21, 1997

Method for post chemical-mechanical planarization cleaning of semiconductor wafers

MICRON TECHNOLOGY INC100 citations98
US6368194B1Apr 9, 2002

Apparatus for controlling PH during planarization and cleaning of microelectronic substrates

MICRON TECHNOLOGY INC135 citations97
US6220934B1Apr 24, 2001

Method for controlling pH during planarization and cleaning of microelectronic substrates

MICRON TECHNOLOGY INC100 citations97
US6329301B1Dec 11, 2001

Method and apparatus for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC25 citations96
US6273101B1Aug 14, 2001

Method for post chemical-mechanical planarization cleaning of semiconductor wafers

MICRON TECHNOLOGY INC53 citations96
US6114706ASep 5, 2000

Method and apparatus for predicting process characteristics of polyurethane pads

MICRON TECHNOLOGY INC46 citations96
US6048405AApr 11, 2000

Megasonic cleaning methods and apparatus

MICRON TECHNOLOGY INC43 citations96
US6006765ADec 28, 1999

Megasonic cleaning methods and apparatus

MICRON TECHNOLOGY INC47 citations96
US5956612ASep 21, 1999

Trench/hole fill processes for semiconductor fabrication

MICRON TECHNOLOGY INC58 citations96
US5894852AApr 20, 1999

Method for post chemical-mechanical planarization cleaning of semiconductor wafers

MICRON TECHNOLOGY INC85 citations96
US5849091ADec 15, 1998

Megasonic cleaning methods and apparatus

MICRON TECHNOLOGY INC78 citations96
US5798302AAug 25, 1998

Low friction polish-stop stratum for endpointing chemical-mechanical planarization processing of semiconductor wafers

MICRON TECHNOLOGY INC75 citations96
US5650619AJul 22, 1997

Quality control method for detecting defective polishing pads used in chemical-mechanical planarization of semiconductor wafers

MICRON TECHNOLOGY INC71 citations96
US6407000B1Jun 18, 2002

Method and apparatuses for making and using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies

MICRON TECHNOLOGY INC35 citations93
US6610610B2Aug 26, 2003

Methods for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC13 citations92
US6447634B1Sep 10, 2002

Method and apparatus for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC23 citations90
US6640816B2Nov 4, 2003

Method for post chemical-mechanical planarization cleaning of semiconductor wafers

MICRON TECHNOLOGY INC14 citations84
US5825028AOct 20, 1998

Quality control method for detecting defective polishing pads used in planarization of semiconductor wafers

MICRON TECHNOLOGY INC16 citations82
US7122475B2Oct 17, 2006

Methods for using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies

MICRON TECHNOLOGY INC6 citations74
US7045017B2May 16, 2006

Method for post chemical-mechanical planarization cleaning of semiconductor wafers

MICRON TECHNOLOGY INC5 citations74
US6794289B2Sep 21, 2004

Method and apparatuses for making and using bi-modal abrasive slurries for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies

MICRON TECHNOLOGY INC12 citations74
US6593657B1Jul 15, 2003

Contact integration article

MICRON TECHNOLOGY INC7 citations74
US6889698B2May 10, 2005

Apparatus for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC3 citations73
US6530113B2Mar 11, 2003

Apparatus for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC8 citations73
US7244681B2Jul 17, 2007

Methods for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC3 citations72
US7214125B2May 8, 2007

Method for controlling pH during planarization and cleaning of microelectronic substrates

MICRON TECHNOLOGY INC9 citations72
US6913523B2Jul 5, 2005

Method for controlling pH during planarization and cleaning of microelectronic substrates

MICRON TECHNOLOGY INC4 citations72
US6716089B2Apr 6, 2004

Method for controlling pH during planarization and cleaning of microelectronic substrates

MICRON TECHNOLOGY INC5 citations72
US7294570B2Nov 13, 2007

Contact integration method

MICRON TECHNOLOGY INC2 citations63
US6803316B2Oct 12, 2004

Method of planarizing by removing all or part of an oxidizable material layer from a semiconductor substrate

MICRON TECHNOLOGY INC2 citations63
US6713384B1Mar 30, 2004

Contact integration method

MICRON TECHNOLOGY INC2 citations63
US6635574B2Oct 21, 2003

Method of removing material from a semiconductor substrate

MICRON TECHNOLOGY INC2 citations63
US6440319B1Aug 27, 2002

Method and apparatus for predicting process characteristics of polyurethane pads

MICRON TECHNOLOGY INC2 citations63
US8053371B2Nov 8, 2011

Apparatus and methods for selective removal of material from wafer alignment marks

MICRON TECHNOLOGY INC0 citations52
USRE39413ENov 28, 2006

Low friction polish-stop stratum for endpointing chemical-mechanical planarization processing of semiconductor wafers

MICRON TECHNOLOGY INC0 citations47

MICRON TECHNOLOGIES INC

1 patent

IBM

1 patent