Inventor
MUCHHERLA KISHORE KUMAR
US277 patents
Patents
50 patentsUS10347344B2Jul 9, 2019
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC61 citations98
US10553290B1Feb 4, 2020
Read disturb scan consolidation
MICRON TECHNOLOGY INC18 citations94
US10283205B2May 7, 2019
Preemptive idle time read scans
MICRON TECHNOLOGY INC34 citations94
US10121551B1Nov 6, 2018
Detecting power loss in NAND memory devices
MICRON TECHNOLOGY INC42 citations94
US9921898B1Mar 20, 2018
Identifying asynchronous power loss
MICRON TECHNOLOGY INC22 citations94
US10199111B1Feb 5, 2019
Memory devices with read level calibration
MICRON TECHNOLOGY INC30 citations93
US11410734B1Aug 9, 2022
Voltage bin selection for blocks of a memory device after power up of the memory device
MICRON TECHNOLOGY INC8 citations86
US11335407B1May 17, 2022
One-ladder read of memory cells coarsely programmed via interleaved two-pass data programming techniques
MICRON TECHNOLOGY INC6 citations86
US11314425B2Apr 26, 2022
Read error recovery
MICRON TECHNOLOGY INC7 citations86
US11256620B1Feb 22, 2022
Cache management based on memory device over-provisioning
MICRON TECHNOLOGY INC8 citations86
US10545685B2Jan 28, 2020
SLC cache management
MICRON TECHNOLOGY INC12 citations86
US10365854B1Jul 30, 2019
Tracking data temperatures of logical block addresses
MICRON TECHNOLOGY INC14 citations86
US11282564B1Mar 22, 2022
Selective wordline scans based on a data state metric
MICRON TECHNOLOGY INC15 citations85
US11211128B1Dec 28, 2021
Performing threshold voltage offset bin selection by package for memory devices
MICRON TECHNOLOGY INC8 citations84
US11175979B2Nov 16, 2021
Prioritization of error control operations at a memory sub-system
MICRON TECHNOLOGY INC6 citations84
US11177014B1Nov 16, 2021
Global-local read calibration
MICRON TECHNOLOGY INC10 citations84
US11106532B1Aug 31, 2021
Selective sampling of a data unit during a program erase cycle based on error rate change patterns
MICRON TECHNOLOGY INC6 citations84
US10777284B2Sep 15, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC4 citations84
US10691377B2Jun 23, 2020
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC6 citations84
US10679704B2Jun 9, 2020
NAND temperature data management
MICRON TECHNOLOGY INC4 citations84
US10672452B2Jun 2, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC7 citations84
US10593412B2Mar 17, 2020
Using a status indicator in a memory sub-system to detect an event
MICRON TECHNOLOGY INC5 citations84
US10586602B2Mar 10, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC6 citations84
US10521146B1Dec 31, 2019
UFS based idle time garbage collection management
MICRON TECHNOLOGY INC5 citations84
US10509722B2Dec 17, 2019
Memory device with dynamic cache management
MICRON TECHNOLOGY INC4 citations84
US10366763B2Jul 30, 2019
Block read count voltage adjustment
MICRON TECHNOLOGY INC4 citations84
US10354732B2Jul 16, 2019
NAND temperature data management
MICRON TECHNOLOGY INC5 citations84
US10892024B2Jan 12, 2021
Scan optimization from stacking multiple reliability specifications
MICRON TECHNOLOGY INC5 citations81
US11886726B2Jan 30, 2024
Block family-based error avoidance for memory devices
MICRON TECHNOLOGY INC3 citations75
US11676664B2Jun 13, 2023
Voltage bin selection for blocks of a memory device after power up of the memory device
MICRON TECHNOLOGY INC4 citations75
US11593005B2Feb 28, 2023
Managing voltage bin selection for blocks of a memory device
MICRON TECHNOLOGY INC4 citations75
US11573720B2Feb 7, 2023
Open block family duration limited by time and temperature
MICRON TECHNOLOGY INC5 citations75
US11983067B2May 14, 2024
Adjustment of code rate as function of memory endurance state metric
MICRON TECHNOLOGY INC2 citations73
US11829245B2Nov 28, 2023
Multi-layer code rate architecture for copyback between partitions with different code rates
MICRON TECHNOLOGY INC3 citations73
US11783901B2Oct 10, 2023
Multi-tier threshold voltage offset bin calibration
MICRON TECHNOLOGY INC3 citations73
US11709727B2Jul 25, 2023
Managing error-handling flows in memory devices
MICRON TECHNOLOGY INC3 citations73
US11709633B2Jul 25, 2023
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC2 citations73
US11609846B2Mar 21, 2023
Managing workload of programming sets of pages to memory device
MICRON TECHNOLOGY INC2 citations73
US11593261B2Feb 28, 2023
Memory device with dynamic cache management
MICRON TECHNOLOGY INC1 citations73
US11587639B2Feb 21, 2023
Voltage calibration scans to reduce memory device overhead
MICRON TECHNOLOGY INC2 citations73
US11557357B2Jan 17, 2023
Selection of read offset values in a memory sub-system
MICRON TECHNOLOGY INC2 citations73
US11455109B2Sep 27, 2022
Automatic wordline status bypass management
MICRON TECHNOLOGY INC1 citations73
US11456038B2Sep 27, 2022
Simplified operations to read memory cells coarsely programmed via interleaved two-pass data programming techniques
MICRON TECHNOLOGY INC2 citations73
US11450391B2Sep 20, 2022
Multi-tier threshold voltage offset bin calibration
MICRON TECHNOLOGY INC2 citations73
US11443830B1Sep 13, 2022
Error avoidance based on voltage distribution parameters of block families
MICRON TECHNOLOGY INC4 citations73
US11437108B1Sep 6, 2022
Voltage bin calibration based on a temporary voltage shift offset
MICRON TECHNOLOGY INC5 citations73
US11360677B2Jun 14, 2022
Selective partitioning of sets of pages programmed to memory device
MICRON TECHNOLOGY INC3 citations73
US11335394B2May 17, 2022
Temperature informed memory refresh
MICRON TECHNOLOGY INC1 citations73
US11287998B2Mar 29, 2022
Read count scaling factor for data integrity scan
MICRON TECHNOLOGY INC5 citations73
US11269553B2Mar 8, 2022
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC3 citations73
Showing the top 50 of 277 patents by PatentIndex Score.