Inventor
RATNAM SAMPATH
US56 patents
Patents
50 patentsUS10347344B2Jul 9, 2019
Read voltage calibration based on host IO operations
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US10283205B2May 7, 2019
Preemptive idle time read scans
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US10365854B1Jul 30, 2019
Tracking data temperatures of logical block addresses
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US10777284B2Sep 15, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC4 citations84
US10691377B2Jun 23, 2020
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC6 citations84
US10679704B2Jun 9, 2020
NAND temperature data management
MICRON TECHNOLOGY INC4 citations84
US10672452B2Jun 2, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC7 citations84
US10586602B2Mar 10, 2020
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC6 citations84
US10366763B2Jul 30, 2019
Block read count voltage adjustment
MICRON TECHNOLOGY INC4 citations84
US10354732B2Jul 16, 2019
NAND temperature data management
MICRON TECHNOLOGY INC5 citations84
US9183070B2Nov 10, 2015
Resting blocks of memory cells in response to the blocks being deemed to fail
MICRON TECHNOLOGY INC8 citations84
US11709633B2Jul 25, 2023
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC2 citations73
US11437108B1Sep 6, 2022
Voltage bin calibration based on a temporary voltage shift offset
MICRON TECHNOLOGY INC5 citations73
US11335394B2May 17, 2022
Temperature informed memory refresh
MICRON TECHNOLOGY INC1 citations73
US11269553B2Mar 8, 2022
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC3 citations73
US11250918B2Feb 15, 2022
Preemptive idle time read scans
MICRON TECHNOLOGY INC1 citations73
US11043278B2Jun 22, 2021
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC2 citations73
US11037630B2Jun 15, 2021
NAND temperature data management
MICRON TECHNOLOGY INC2 citations73
US11031089B2Jun 8, 2021
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US11023177B2Jun 1, 2021
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC1 citations73
US10998034B2May 4, 2021
Temperature informed memory refresh
MICRON TECHNOLOGY INC2 citations73
US10915395B2Feb 9, 2021
Read retry with targeted auto read calibrate
MICRON TECHNOLOGY INC2 citations73
US10818361B2Oct 27, 2020
Preemptive idle time read scans
MICRON TECHNOLOGY INC2 citations73
US10796745B2Oct 6, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC2 citations73
US10755792B2Aug 25, 2020
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US10719271B2Jul 21, 2020
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC4 citations73
US10579307B2Mar 3, 2020
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations73
US10573357B2Feb 25, 2020
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10446197B2Oct 15, 2019
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US11934266B2Mar 19, 2024
Memory compaction management in memory devices
MICRON TECHNOLOGY INC2 citations72
US10430116B2Oct 1, 2019
Correcting power loss in NAND memory devices
MICRON TECHNOLOGY INC2 citations72
US11670381B2Jun 6, 2023
Read voltage calibration based on host IO operations
MICRON TECHNOLOGY INC0 citations63
US11436078B2Sep 6, 2022
NAND parity information techniques for systems with limited RAM
MICRON TECHNOLOGY INC0 citations63
US11068197B2Jul 20, 2021
Tracking data temperatures of logical block addresses
MICRON TECHNOLOGY INC0 citations63
US10977115B2Apr 13, 2021
NAND parity information techniques for systems with limited RAM
MICRON TECHNOLOGY INC1 citations63
US12393363B2Aug 19, 2025
Voltage bin calibration based on a voltage distribution reference voltage
MICRON TECHNOLOGY INC0 citations62
US12332742B2Jun 17, 2025
Memory compaction management in memory devices
MICRON TECHNOLOGY INC0 citations62
US11966616B2Apr 23, 2024
Voltage bin calibration based on a voltage distribution reference voltage
MICRON TECHNOLOGY INC0 citations62
US11887651B2Jan 30, 2024
Temperature informed memory refresh
MICRON TECHNOLOGY INC0 citations62
US11823748B2Nov 21, 2023
Voltage bin calibration based on a temporary voltage shift offset
MICRON TECHNOLOGY INC0 citations62
US11620074B2Apr 4, 2023
Voltage bin calibration based on a voltage distribution reference voltage
MICRON TECHNOLOGY INC0 citations62
US11610632B2Mar 21, 2023
NAND temperature data management
MICRON TECHNOLOGY INC0 citations62
US11544008B2Jan 3, 2023
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC0 citations62
US11456037B2Sep 27, 2022
Block read count voltage adjustment
MICRON TECHNOLOGY INC0 citations62
US11056156B2Jul 6, 2021
Optimized scan interval
MICRON TECHNOLOGY INC0 citations62
US12307121B2May 20, 2025
Filtering metrics associated with memory
MICRON TECHNOLOGY INC0 citations59
US11024394B2Jun 1, 2021
Implementing sticky read using error control success rate associated with a memory sub-system
MICRON TECHNOLOGY INC0 citations59
US10658047B1May 19, 2020
Implementing sticky read using error control success rate associated with a memory sub-system
MICRON TECHNOLOGY INC1 citations59
US12450014B2Oct 21, 2025
Preemptively warning host of background folding
MICRON TECHNOLOGY INC0 citations58
US12572307B2Mar 10, 2026
Read-ahead based on read size and queue identifier
MICRON TECHNOLOGY INC0 citations52
Showing the top 50 of 56 patents by PatentIndex Score.