Inventor
TUKKER TEUNIS WILLEM
NL32 patents
⚠️ This page may combine multiple inventors who share the name “TUKKER TEUNIS WILLEM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KONINKL PHILIPS ELECTRONICS NV
14 patentsUS7907345B2Mar 15, 2011
Collimating module and device for zero overfill illumination applications with beam width control
KONINKL PHILIPS ELECTRONICS NV34 citations92
US6806959B2Oct 19, 2004
Measurement of surface defects on a movable surface
KONINKL PHILIPS ELECTRONICS NV26 citations92
US7170832B2Jan 30, 2007
Optical scanning device
KONINKL PHILIPS ELECTRONICS NV10 citations84
US7310189B2Dec 18, 2007
Variable beam shaping element
KONINKL PHILIPS ELECTRONICS NV2 citations63
US7130258B2Oct 31, 2006
Field curvature reduction for optical system
KONINKL PHILIPS ELECTRONICS NV4 citations62
US6906803B2Jun 14, 2005
Inspection of surfaces
KONINKL PHILIPS ELECTRONICS NV2 citations62
US7034974B2Apr 25, 2006
Optical scanning device including a tilt tolerant objective system
KONINKL PHILIPS ELECTRONICS NV2 citations61
US7994530B2Aug 9, 2011
Light emitting diode module
KONINKL PHILIPS ELECTRONICS NV1 citations51
US7161891B2Jan 9, 2007
Optical scanning device
KONINKL PHILIPS ELECTRONICS NV1 citations50
US7939996B2May 10, 2011
Display device with solid state fluorescent material
KONINKL PHILIPS ELECTRONICS NV0 citations48
US7453564B2Nov 18, 2008
Method of determining a property of a fluid and spectroscopic system
KONINKL PHILIPS ELECTRONICS NV1 citations47
US7359294B2Apr 15, 2008
Optical scanning device with tilt detection
KONINKL PHILIPS ELECTRONICS NV1 citations47
US7602691B2Oct 13, 2009
Diffractive part
KONINKL PHILIPS ELECTRONICS NV0 citations42
US7706234B2Apr 27, 2010
Optical head with switchable diameter of the radiation spot on the radiation detector
KONINKL PHILIPS ELECTRONICS NV0 citations38
ASML NETHERLANDS BV
8 patentsUS10180630B2Jan 15, 2019
Illumination system for a lithographic or inspection apparatus
ASML NETHERLANDS BV2 citations73
US10725381B2Jul 28, 2020
Optical systems, metrology apparatus and associated method
ASML NETHERLANDS BV3 citations71
US10534274B2Jan 14, 2020
Method of inspecting a substrate, metrology apparatus, and lithographic system
ASML NETHERLANDS BV2 citations71
US10437159B2Oct 8, 2019
Measurement system, lithographic system, and method of measuring a target
ASML NETHERLANDS BV2 citations71
US10303064B2May 28, 2019
Radiation conditioning system, illumination system and metrology apparatus, device manufacturing method
ASML NETHERLANDS BV2 citations68
US10234767B2Mar 19, 2019
Device and method for processing a radiation beam with coherence
ASML NETHERLANDS BV1 citations62
US12086973B2Sep 10, 2024
Detection apparatus for simultaneous acquisition of multiple diverse images of an object
ASML NETHERLANDS BV0 citations51
US10495889B2Dec 3, 2019
Beam homogenizer, illumination system and metrology system
ASML NETHERLANDS BV0 citations51