Inventor
RANGANATHAN KARTHIK
US59 patents
⚠️ This page may combine multiple inventors who share the name “RANGANATHAN KARTHIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST TEST SOLUTIONS INC
32 patentsUS11567119B2Jan 31, 2023
Testing system including active thermal interposer device
ADVANTEST TEST SOLUTIONS INC10 citations93
US10656200B2May 19, 2020
High volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC35 citations92
US11493551B2Nov 8, 2022
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
ADVANTEST TEST SOLUTIONS INC28 citations90
US11573262B2Feb 7, 2023
Multi-input multi-zone thermal control for device testing
ADVANTEST TEST SOLUTIONS INC9 citations86
US11674999B2Jun 13, 2023
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC10 citations85
US11587640B2Feb 21, 2023
Carrier based high volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC6 citations85
US11852678B2Dec 26, 2023
Multi-input multi-zone thermal control for device testing
ADVANTEST TEST SOLUTIONS INC2 citations73
US11821913B2Nov 21, 2023
Shielded socket and carrier for high-volume test of semiconductor devices
ADVANTEST TEST SOLUTIONS INC4 citations73
US11742055B2Aug 29, 2023
Carrier based high volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC2 citations73
US11754620B2Sep 12, 2023
DUT placement and handling for active thermal interposer device
ADVANTEST TEST SOLUTIONS INC2 citations72
US12174248B2Dec 24, 2024
Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system
ADVANTEST TEST SOLUTIONS INC5 citations71
US11835549B2Dec 5, 2023
Thermal array with gimbal features and enhanced thermal performance
ADVANTEST TEST SOLUTIONS INC3 citations71
US12540968B2Feb 3, 2026
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12540967B2Feb 3, 2026
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12535522B2Jan 27, 2026
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12411167B2Sep 9, 2025
Tension-based socket gimbal for engaging device under test with thermal array
ADVANTEST TEST SOLUTIONS INC1 citations62
US12374420B2Jul 29, 2025
Carrier based high volume system level testing of devices with pop structures
ADVANTEST TEST SOLUTIONS INC0 citations62
US12320841B2Jun 3, 2025
Wafer scale active thermal interposer for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12320852B2Jun 3, 2025
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
ADVANTEST TEST SOLUTIONS INC0 citations62
US12216154B2Feb 4, 2025
Active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations62
US12203979B2Jan 21, 2025
Multi-input multi-zone thermal control for device testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US11940487B2Mar 26, 2024
Thermal solution for massively parallel testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US11846669B2Dec 19, 2023
Active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations62
US11808812B2Nov 7, 2023
Passive carrier-based device delivery for slot-based high-volume semiconductor test system
ADVANTEST TEST SOLUTIONS INC1 citations62
US11609266B2Mar 21, 2023
Active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations62
US11549981B2Jan 10, 2023
Thermal solution for massively parallel testing
ADVANTEST TEST SOLUTIONS INC0 citations62
US12203958B2Jan 21, 2025
Shielded socket and carrier for high-volume test of semiconductor devices
ADVANTEST TEST SOLUTIONS INC0 citations61
US11774492B2Oct 3, 2023
Test system including active thermal interposer device
ADVANTEST TEST SOLUTIONS INC0 citations61
US12235314B2Feb 25, 2025
Parallel test cell with self actuated sockets
ADVANTEST TEST SOLUTIONS INC0 citations60
US12210056B2Jan 28, 2025
Thermal array with gimbal features and enhanced thermal performance
ADVANTEST TEST SOLUTIONS INC0 citations60
US12345756B2Jul 1, 2025
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
ADVANTEST TEST SOLUTIONS INC0 citations59
US11841392B2Dec 12, 2023
Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
ADVANTEST TEST SOLUTIONS INC0 citations59
YugaByte Inc
5 patentsUS11095714B2Aug 17, 2021
Orchestration of data services in multiple cloud infrastructures
YugaByte Inc4 citations79
US10749951B2Aug 18, 2020
Selection of leader nodes in distributed data services
YugaByte Inc4 citations79
US11882177B2Jan 23, 2024
Orchestration of data services in multiple cloud infrastructures
YugaByte Inc0 citations58
US11509713B2Nov 22, 2022
Selection of leader nodes in distributed data services
YugaByte Inc0 citations57
US11375008B2Jun 28, 2022
Consumption of data services provisioned in cloud infrastructures
YugaByte Inc0 citations54
FACEBOOK INC
4 patentsNUTANIX INC
2 patentsNELSON ELIZABETH
2 patentsDELL PRODUCTS LP
2 patentsBECTON DICKINSON CO
1 patentMICROSOFT CORP
1 patentINTERVOICE LP
1 patentShowing the top 50 of 59 patents by PatentIndex Score.