Inventor

CRUZAN GREGORY

US32 patents

⚠️ This page may combine multiple inventors who share the name “CRUZAN GREGORY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CRUZAN GREGORY

ADVANTEST TEST SOLUTIONS INC

Testing system including active thermal interposer device

High volume system level testing of devices with pop structures

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

Multi-input multi-zone thermal control for device testing

Wafer scale active thermal interposer for device testing

Carrier based high volume system level testing of devices with pop structures

Multi-input multi-zone thermal control for device testing

Carrier based high volume system level testing of devices with pop structures

DUT placement and handling for active thermal interposer device

Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test system

Thermal array with gimbal features and enhanced thermal performance

Wafer scale active thermal interposer for device testing

Wafer scale active thermal interposer for device testing

Wafer scale active thermal interposer for device testing

Tension-based socket gimbal for engaging device under test with thermal array

Carrier based high volume system level testing of devices with pop structures

Wafer scale active thermal interposer for device testing

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

Active thermal interposer device

Multi-input multi-zone thermal control for device testing

Thermal solution for massively parallel testing

Active thermal interposer device

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

Active thermal interposer device

Thermal solution for massively parallel testing

Test system including active thermal interposer device

Parallel test cell with self actuated sockets

Thermal array with gimbal features and enhanced thermal performance

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

High current device testing apparatus and systems

EADS NORTH AMERICA INC

Evaporator