Inventor
ANDO TOHRU
JP19 patents
⚠️ This page may combine multiple inventors who share the name “ANDO TOHRU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
12 patentsUSD774075SDec 13, 2016
Display screen with graphical user interface
HITACHI HIGH TECH CORP22 citations92
US7663104B2Feb 16, 2010
Specimen inspection equipment and how to make electron beam absorbed current images
HITACHI HIGH TECH CORP6 citations71
US7732791B2Jun 8, 2010
Semiconductor testing method and semiconductor tester
HITACHI HIGH TECH CORP5 citations62
US7989766B2Aug 2, 2011
Sample inspection apparatus
HITACHI HIGH TECH CORP2 citations61
US9129773B2Sep 8, 2015
Charged particle beam apparatus
HITACHI HIGH TECH CORP2 citations60
US7700916B2Apr 20, 2010
Logical CAD navigation for device characteristics evaluation system
HITACHI HIGH TECH CORP2 citations60
US9741531B2Aug 22, 2017
Charged particle beam device enabling facilitated EBSD detector analysis of desired position and control method thereof
HITACHI HIGH TECH CORP0 citations51
USD780767SMar 7, 2017
Display screen with graphical user interface
HITACHI HIGH TECH CORP1 citations50
USD774516SDec 20, 2016
Display screen with graphical user interface
HITACHI HIGH TECH CORP1 citations48
US9792832B2Oct 17, 2017
Charged particle beam apparatus, specimen observation system and operation program
HITACHI HIGH TECH CORP0 citations39
US10176968B2Jan 8, 2019
Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for same
HITACHI HIGH TECH CORP0 citations38
US9412557B2Aug 9, 2016
Charged particle beam apparatus and program
HITACHI HIGH TECH CORP0 citations36
ANDO TOHRU
3 patentsUS8309922B2Nov 13, 2012
Semiconductor inspection method and device that consider the effects of electron beams
ANDO TOHRU2 citations59
US8067752B2Nov 29, 2011
Semiconductor testing method and semiconductor tester
ANDO TOHRU0 citations49
US8178837B2May 15, 2012
Logical CAD navigation for device characteristics evaluation system
ANDO TOHRU0 citations47