Inventor

WANG DAVID Y

US51 patents

⚠️ This page may combine multiple inventors who share the name “WANG DAVID Y”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

WANG DAVID Y

KLA TENCOR CORP

Dynamically adjustable semiconductor metrology system

Metrology systems and methods for high aspect ratio and large lateral dimension structures

Multiple angles of incidence semiconductor metrology systems and methods

Optical metrology tool equipped with modulated illumination sources

Simultaneous multi-angle spectroscopy

Multiple angles of incidence semiconductor metrology systems and methods

Semiconductor metrology based on hyperspectral imaging

Infrared spectroscopic reflectometer for measurement of high aspect ratio structures

Systems and methods for extended infrared spectroscopic ellipsometry

Methods and systems for measurement of thick films and high aspect ratio structures

Optical metrology tool equipped with modulated illumination sources

Optical metrology tool equipped with modulated illumination sources

Broadband and wide field angle compensator

Broadband and wide field angle compensator

Optical metrology with reduced focus error sensitivity

KLA CORP

Monolithic optical retarder

Overlay metrology on bonded wafers

Mid-infrared spectroscopy for measurement of high aspect ratio structures

Multi-environment polarized infrared reflectometer for semiconductor metrology

Optical metrology tool equipped with modulated illumination sources

Methods and systems for measurement of thick films and high aspect ratio structures

Magneto-optic Kerr effect metrology systems

Measurement of thick films and high aspect ratio structures

Optics for measurement of thick films and high aspect ratio structures

Methods and systems for compact, small spot size soft x-ray scatterometry

Reflective compact lens for magneto-optic Kerr effect metrology system

THERMA WAVE INC

Compact imaging spectrometer

Broadband refractive objective for small spot optical metrology

Measurement system with separate optimized beam paths

Optical metrology tool having improved contrast

Infrared blocking filter for broadband Optical metrology

Focusing optics for small spot optical metrology

Broadband refractive objective for small spot optical metrology

Measurement system with separate optimized beam paths

Flat spectrum illumination source for optical metrology

NEOAXIOM CORP

Divide-by-N differential phase interpolator

Differential active loop filter for phase locked loop circuits

Cross clocked lock detector circuit for phase locked loop

Flip-flop with metastability reduction

EXXON PRODUCTION RESEARCH CO

Method for deriving reservoir lithology and fluid content from pre-stack inversion of seismic data

Method for determining seismic data traveltime fields on a massively parallel computer

ROTTER LAWRENCE D

Angle-resolved spectroscopic instrument

System and method for performing photothermal measurements and relaxation compensation

XAQTI CORP

Multi-phase data/clock recovery circuitry and methods for implementing same

ACARD TECHNOLOGY CORP

Method and apparatus for high-speed clock data recovery using low-speed circuits

KLA TENCOR TECHNOLOGIES

Broadband wavelength selective filter

HILL ANDREW V

Discrete polarization scatterometry

EASTMAN KODAK CO

Method of providing photopatterned functional surfaces

ZHUANG GUORONG V

Light source tracking in optical metrology system

WANG DAVID Y

Finger-driven computer mouse