Inventor
RICHTER DETLEV
DE31 patents
⚠️ This page may combine multiple inventors who share the name “RICHTER DETLEV”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
QIMONDA AG
12 patentsUS7688634B2Mar 30, 2010
Method of operating an integrated circuit having at least one memory cell
QIMONDA AG21 citations92
US7800943B2Sep 21, 2010
Integrated circuit having a memory cell arrangement and method for reading a memory cell state using a plurality of partial readings
QIMONDA AG28 citations90
US7778073B2Aug 17, 2010
Integrated circuit having NAND memory cell strings
QIMONDA AG9 citations84
US7940575B2May 10, 2011
Memory device and method providing logic connections for data transfer
QIMONDA AG9 citations83
US7864579B2Jan 4, 2011
Integrated circuits having a controller to control a read operation and methods for operating the same
QIMONDA AG15 citations81
US8589765B1Nov 19, 2013
Memory read-out
QIMONDA AG5 citations80
US7649779B2Jan 19, 2010
Integrated circuits; methods for manufacturing an integrated circuit; memory modules; computing systems
QIMONDA AG16 citations78
US7864593B2Jan 4, 2011
Method for classifying memory cells in an integrated circuit
QIMONDA AG5 citations60
US7783826B2Aug 24, 2010
Data bus width converter
QIMONDA AG2 citations59
US7707380B2Apr 27, 2010
Memories, method of storing data in memory and method of determining memory cell sector quality
QIMONDA AG4 citations59
US7602649B2Oct 13, 2009
Method of operating an integrated circuit for reading the logical state of a memory cell
QIMONDA AG0 citations52
US7920430B2Apr 5, 2011
Integrated circuits and methods for operating the same using a plurality of buffer circuits in an access operation
QIMONDA AG1 citations48
INFINEON TECHNOLOGIES AG
7 patentsUS7296202B2Nov 13, 2007
Semiconductor module with a configuration for the self-test of a plurality of interface circuits and test method
INFINEON TECHNOLOGIES AG8 citations74
US6779136B2Aug 17, 2004
Method for testing the refresh device of an information memory
INFINEON TECHNOLOGIES AG10 citations73
US6279129B1Aug 21, 2001
Configuration of memory cells and method of checking the operation of memory cells
INFINEON TECHNOLOGIES AG7 citations72
US6877897B2Apr 12, 2005
Method for determining the temperature of a memory cell from transistor threshold voltage
INFINEON TECHNOLOGIES AG4 citations61
US6910163B2Jun 21, 2005
Method and configuration for the output of bit error tables from semiconductor devices
INFINEON TECHNOLOGIES AG2 citations60
US6158029ADec 5, 2000
Method of testing an integrated circuit having a memory and a test circuit
INFINEON TECHNOLOGIES AG6 citations57
US7437629B2Oct 14, 2008
Method for checking the refresh function of an information memory
INFINEON TECHNOLOGIES AG0 citations52
PHILIPS CORP
3 patentsUS4121104AOct 17, 1978
X-ray examining device with automatic timer and film container for an X-ray examining device
PHILIPS CORP14 citations74
US4486896ADec 4, 1984
X-Ray generator incorporating automatic correction of a dose-determining exposure parameter
PHILIPS CORP12 citations66
US4313055AJan 26, 1982
Automatic exposure control device for an X-ray generator
PHILIPS CORP6 citations61