P

Inventor

HSIEH CHAO-CHING

TW26 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH CHAO-CHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

23 patents
US10283564B1May 7, 2019

Semiconductor structure and the method of making the same

UNITED MICROELECTRONICS CORP8 citations84
US10269868B1Apr 23, 2019

Semiconductor structure and the method of making the same

UNITED MICROELECTRONICS CORP12 citations84
US10177311B1Jan 8, 2019

Resistive random access memory (RRAM) and fabrication method thereof

UNITED MICROELECTRONICS CORP11 citations84
US7915127B2Mar 29, 2011

Manufacturing method of semiconductor device

UNITED MICROELECTRONICS CORP7 citations84
US7390754B2Jun 24, 2008

Method of forming a silicide

UNITED MICROELECTRONICS CORP9 citations83
US7344978B2Mar 18, 2008

Fabrication method of semiconductor device

UNITED MICROELECTRONICS CORP9 citations82
US7482668B2Jan 27, 2009

Semiconductor device

UNITED MICROELECTRONICS CORP5 citations73
US6371045B1Apr 16, 2002

Physical vapor deposition device for forming a metallic layer on a semiconductor wafer

UNITED MICROELECTRONICS CORP12 citations73
US7951662B2May 31, 2011

Method of fabricating strained silicon transistor

UNITED MICROELECTRONICS CORP2 citations62
US7892935B2Feb 22, 2011

Semiconductor process

UNITED MICROELECTRONICS CORP2 citations62
US7884028B2Feb 8, 2011

Method of removing material layer and remnant metal

UNITED MICROELECTRONICS CORP3 citations62
US7785972B2Aug 31, 2010

Method for fabricating semiconductor MOS device

UNITED MICROELECTRONICS CORP2 citations62
US7432167B2Oct 7, 2008

Method of fabricating a strained silicon channel metal oxide semiconductor transistor

UNITED MICROELECTRONICS CORP5 citations62
US7390729B2Jun 24, 2008

Method of fabricating a semiconductor device

UNITED MICROELECTRONICS CORP4 citations62
US7229920B2Jun 12, 2007

Method of fabricating metal silicide layer

UNITED MICROELECTRONICS CORP4 citations61
US10636794B2Apr 28, 2020

Magnetic tunnel junction structure of magnetic random access memory cell

UNITED MICROELECTRONICS CORP0 citations52
US10312238B2Jun 4, 2019

Manufacturing method of magnetic random access memory cell

UNITED MICROELECTRONICS CORP0 citations52
US7649263B2Jan 19, 2010

Semiconductor device

UNITED MICROELECTRONICS CORP1 citations51
US7595264B2Sep 29, 2009

Fabrication method of semiconductor device

UNITED MICROELECTRONICS CORP0 citations51
US7572722B2Aug 11, 2009

Method of fabricating nickel silicide

UNITED MICROELECTRONICS CORP0 citations51
US7553762B2Jun 30, 2009

Method for forming metal silicide layer

UNITED MICROELECTRONICS CORP1 citations51
US7385294B2Jun 10, 2008

Semiconductor device having nickel silicide and method of fabricating nickel silicide

UNITED MICROELECTRONICS CORP0 citations51
US7670438B2Mar 2, 2010

Method of removing particles from wafer

UNITED MICROELECTRONICS CORP0 citations49

LIN CHUN-HSIEN

1 patent

CHEN NENG-KUO

1 patent

HSIEH CHAO-CHING

1 patent