Inventor
HSIEH CHAO-CHING
TW26 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH CHAO-CHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
23 patentsUS10283564B1May 7, 2019
Semiconductor structure and the method of making the same
UNITED MICROELECTRONICS CORP8 citations84
US10269868B1Apr 23, 2019
Semiconductor structure and the method of making the same
UNITED MICROELECTRONICS CORP12 citations84
US10177311B1Jan 8, 2019
Resistive random access memory (RRAM) and fabrication method thereof
UNITED MICROELECTRONICS CORP11 citations84
US7915127B2Mar 29, 2011
Manufacturing method of semiconductor device
UNITED MICROELECTRONICS CORP7 citations84
US7390754B2Jun 24, 2008
Method of forming a silicide
UNITED MICROELECTRONICS CORP9 citations83
US7344978B2Mar 18, 2008
Fabrication method of semiconductor device
UNITED MICROELECTRONICS CORP9 citations82
US7482668B2Jan 27, 2009
Semiconductor device
UNITED MICROELECTRONICS CORP5 citations73
US6371045B1Apr 16, 2002
Physical vapor deposition device for forming a metallic layer on a semiconductor wafer
UNITED MICROELECTRONICS CORP12 citations73
US7951662B2May 31, 2011
Method of fabricating strained silicon transistor
UNITED MICROELECTRONICS CORP2 citations62
US7892935B2Feb 22, 2011
Semiconductor process
UNITED MICROELECTRONICS CORP2 citations62
US7884028B2Feb 8, 2011
Method of removing material layer and remnant metal
UNITED MICROELECTRONICS CORP3 citations62
US7785972B2Aug 31, 2010
Method for fabricating semiconductor MOS device
UNITED MICROELECTRONICS CORP2 citations62
US7432167B2Oct 7, 2008
Method of fabricating a strained silicon channel metal oxide semiconductor transistor
UNITED MICROELECTRONICS CORP5 citations62
US7390729B2Jun 24, 2008
Method of fabricating a semiconductor device
UNITED MICROELECTRONICS CORP4 citations62
US7229920B2Jun 12, 2007
Method of fabricating metal silicide layer
UNITED MICROELECTRONICS CORP4 citations61
US10636794B2Apr 28, 2020
Magnetic tunnel junction structure of magnetic random access memory cell
UNITED MICROELECTRONICS CORP0 citations52
US10312238B2Jun 4, 2019
Manufacturing method of magnetic random access memory cell
UNITED MICROELECTRONICS CORP0 citations52
US7649263B2Jan 19, 2010
Semiconductor device
UNITED MICROELECTRONICS CORP1 citations51
US7595264B2Sep 29, 2009
Fabrication method of semiconductor device
UNITED MICROELECTRONICS CORP0 citations51
US7572722B2Aug 11, 2009
Method of fabricating nickel silicide
UNITED MICROELECTRONICS CORP0 citations51
US7553762B2Jun 30, 2009
Method for forming metal silicide layer
UNITED MICROELECTRONICS CORP1 citations51
US7385294B2Jun 10, 2008
Semiconductor device having nickel silicide and method of fabricating nickel silicide
UNITED MICROELECTRONICS CORP0 citations51
US7670438B2Mar 2, 2010
Method of removing particles from wafer
UNITED MICROELECTRONICS CORP0 citations49