Inventor
TASHIRO JUNICHI
JP31 patents
⚠️ This page may combine multiple inventors who share the name “TASHIRO JUNICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
OLYMPUS CORP
7 patentsUS12003891B2Jun 4, 2024
Image recording apparatus, image recording method, and endoscope system
OLYMPUS CORP0 citations52
US10561299B2Feb 18, 2020
Medical information recording device
OLYMPUS CORP0 citations52
US10951800B2Mar 16, 2021
Endoscope system and endoscope processor
OLYMPUS CORP0 citations51
US9584795B2Feb 28, 2017
Wireless transfer system
OLYMPUS CORP1 citations51
US10993608B2May 4, 2021
Endoscope system and control method
OLYMPUS CORP0 citations50
US10728470B2Jul 28, 2020
Image processing device, image processing method, and non-transitory computer readable medium storing image processing program
OLYMPUS CORP0 citations41
US9661081B2May 23, 2017
Wireless image transfer system and wireless image transfer method
OLYMPUS CORP0 citations40
SII NANOTECHNOLOGY INC
6 patentsUS7172839B2Feb 6, 2007
Photomask correction method using composite charged particle beam, and device used in the correction method
SII NANOTECHNOLOGY INC10 citations84
US7423266B2Sep 9, 2008
Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus
SII NANOTECHNOLOGY INC7 citations73
US7755044B2Jul 13, 2010
Apparatus for working and observing samples and method of working and observing cross sections
SII NANOTECHNOLOGY INC2 citations63
US7595488B2Sep 29, 2009
Method and apparatus for specifying working position on a sample and method of working the sample
SII NANOTECHNOLOGY INC2 citations62
US7531796B2May 12, 2009
Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods
SII NANOTECHNOLOGY INC3 citations62
US7923267B2Apr 12, 2011
Method of measuring length of measurement object article in micro-structure
SII NANOTECHNOLOGY INC0 citations50
OLYMPUS MEDICAL SYSTEMS CORP
2 patentsTOSHIBA MEDICAL SYS CORP
2 patentsKAITO TAKASHI
2 patentsUS8274063B2Sep 25, 2012
Composite focused ion beam device, process observation method using the same, and processing method
KAITO TAKASHI4 citations60
US8269194B2Sep 18, 2012
Composite focused ion beam device, and processing observation method and processing method using the same
KAITO TAKASHI3 citations60