Inventor

LAHIRI SUDEEP KUMAR

US2 patents

Patents

2 patents

US8106651B2Jan 31, 2012

Methods and apparatuses for determining thickness of a conductive layer

LAHIRI SUDEEP KUMAR25 citations85

US9007059B2Apr 14, 2015

Methods for monitoring thickness of a conductive layer

LAHIRI SUDEEP KUMAR0 citations45