P

Inventor

FUKUMA TAKESHI

JP11 patents
⚠️ This page may combine multiple inventors who share the name “FUKUMA TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUKUMA TAKESHI

3 patents
US8839461B2Sep 16, 2014

Potential measurement device and atomic force microscope

FUKUMA TAKESHI5 citations65
US8341760B2Dec 25, 2012

Scanning probe microscope

FUKUMA TAKESHI3 citations56
US8217367B2Jul 10, 2012

Scanner device for scanning probe microscope

FUKUMA TAKESHI1 citations48

HITACHI LTD

2 patents
US7363614B2Apr 22, 2008

Automatic test program generation method

HITACHI LTD13 citations76
US10215686B2Feb 26, 2019

Metal corrosion resistance evaluation method and evaluation device using in-liquid potential measurement

HITACHI LTD1 citations56

UNIV KANAZAWA NAT UNIV CORP

2 patents
US8387159B2Feb 26, 2013

Scanning type probe microscope

UNIV KANAZAWA NAT UNIV CORP4 citations60
US9110093B2Aug 18, 2015

Sealed AFM cell

UNIV KANAZAWA NAT UNIV CORP0 citations28

UOZUMI SHINGO

1 patent
US8166848B2May 1, 2012

Transmission case

UOZUMI SHINGO9 citations75

IKE NOBUKAZU

1 patent
US8323139B2Dec 4, 2012

Vehicle drive device

IKE NOBUKAZU4 citations53

ASAKAWA HITOSHI

1 patent
US8505111B2Aug 6, 2013

Cantilever excitation device and scanning probe microscope

ASAKAWA HITOSHI2 citations48

NAT UNIV CORP KANAZAWA UNIV

1 patent
US9535088B2Jan 3, 2017

Signal detection circuit and scanning probe microscope

NAT UNIV CORP KANAZAWA UNIV0 citations43