Inventor
NGUYEN HAU
US18 patents
⚠️ This page may combine multiple inventors who share the name “NGUYEN HAU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
13 patentsUS9663357B2May 30, 2017
Open cavity package using chip-embedding technology
TEXAS INSTRUMENTS INC12 citations83
US10541220B1Jan 21, 2020
Printed repassivation for wafer chip scale packaging
TEXAS INSTRUMENTS INC4 citations73
US11736085B2Aug 22, 2023
Metal ribs in electromechanical devices
TEXAS INSTRUMENTS INC2 citations72
US10312184B2Jun 4, 2019
Semiconductor systems having premolded dual leadframes
TEXAS INSTRUMENTS INC2 citations72
US10763231B2Sep 1, 2020
Bump bond structure for enhanced electromigration performance
TEXAS INSTRUMENTS INC2 citations71
US12021019B2Jun 25, 2024
Semiconductor device package with thermal pad
TEXAS INSTRUMENTS INC2 citations67
US12160219B2Dec 3, 2024
Metal ribs in electromechanical devices
TEXAS INSTRUMENTS INC1 citations62
US11367699B2Jun 21, 2022
Integrated circuit backside metallization
TEXAS INSTRUMENTS INC0 citations62
US10763230B2Sep 1, 2020
Integrated circuit backside metallization
TEXAS INSTRUMENTS INC1 citations62
US11450638B2Sep 20, 2022
Bump bond structure for enhanced electromigration performance
TEXAS INSTRUMENTS INC0 citations60
US11955456B2Apr 9, 2024
Flip chip packaged devices with thermal pad
TEXAS INSTRUMENTS INC0 citations55
US10573582B2Feb 25, 2020
Semiconductor systems having dual leadframes
TEXAS INSTRUMENTS INC0 citations51
US12074134B2Aug 27, 2024
Package for stress sensitive component and semiconductor device
TEXAS INSTRUMENTS INC0 citations47
NAT SEMICONDUCTOR CORP
4 patentsUS7423337B1Sep 9, 2008
Integrated circuit device package having a support coating for improved reliability during temperature cycling
NAT SEMICONDUCTOR CORP11 citations80
US7755200B2Jul 13, 2010
Methods and arrangements for forming solder joint connections
NAT SEMICONDUCTOR CORP5 citations61
US7812462B2Oct 12, 2010
Conductive paths for transmitting an electrical signal through an electrical connector
NAT SEMICONDUCTOR CORP4 citations59
US7629246B2Dec 8, 2009
High strength solder joint formation method for wafer level packages and flip applications
NAT SEMICONDUCTOR CORP1 citations50