P

Inventor

CHANG KUO-PIN

TW52 patents
⚠️ This page may combine multiple inventors who share the name “CHANG KUO-PIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MACRONIX INT CO LTD

21 patents
US7777215B2Aug 17, 2010

Resistive memory structure with buffer layer

MACRONIX INT CO LTD57 citations98
US9620217B2Apr 11, 2017

Sub-block erase

MACRONIX INT CO LTD24 citations94
US7960224B2Jun 14, 2011

Operation method for multi-level switching of metal-oxide based RRAM

MACRONIX INT CO LTD21 citations93
US10593697B1Mar 17, 2020

Memory device

MACRONIX INT CO LTD15 citations86
US9721668B2Aug 1, 2017

3D non-volatile memory array with sub-block erase architecture

MACRONIX INT CO LTD12 citations84
US9530503B2Dec 27, 2016

And-type SGVC architecture for 3D NAND flash

MACRONIX INT CO LTD7 citations84
US7943920B2May 17, 2011

Resistive memory structure with buffer layer

MACRONIX INT CO LTD10 citations84
US9685233B2Jun 20, 2017

Programming multibit memory cells

MACRONIX INT CO LTD11 citations83
US8760928B2Jun 24, 2014

NAND flash biasing operation

MACRONIX INT CO LTD13 citations83
US9171636B2Oct 27, 2015

Hot carrier generation and programming in NAND flash

MACRONIX INT CO LTD9 citations81
US10811427B1Oct 20, 2020

Semiconductor structure and manufacturing method thereof

MACRONIX INT CO LTD4 citations73
US9761319B1Sep 12, 2017

Reading method for preventing read disturbance and memory using the same

MACRONIX INT CO LTD2 citations73
US9607702B2Mar 28, 2017

Sub-block page erase in 3D p-channel flash memory

MACRONIX INT CO LTD5 citations73
US9466384B1Oct 11, 2016

Memory device and associated erase method

MACRONIX INT CO LTD5 citations73
US9373409B2Jun 21, 2016

Systems and methods for reduced program disturb for 3D NAND flash

MACRONIX INT CO LTD3 citations70
US9520199B2Dec 13, 2016

Memory device and reading method thereof

MACRONIX INT CO LTD2 citations63
US9361989B1Jun 7, 2016

Memory device and data erasing method thereof

MACRONIX INT CO LTD2 citations63
US9490017B2Nov 8, 2016

Forced-bias method in sub-block erase

MACRONIX INT CO LTD2 citations60
US10886222B2Jan 5, 2021

Via contact, memory device, and method of forming semiconductor structure

MACRONIX INT CO LTD0 citations52
US9747989B1Aug 29, 2017

Memory device and control method thereof

MACRONIX INT CO LTD1 citations52
US9305653B1Apr 5, 2016

Memory array and operating method of same

MACRONIX INT CO LTD1 citations52

TAIWAN SEMICONDUCTOR MFG CO LTD

21 patents
US10878915B1Dec 29, 2020

Memory device and method for programming the same

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10163849B2Dec 25, 2018

Method of manufacturing semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12308078B2May 20, 2025

One-time programmable (OTP) memory and method of operating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12142653B2Nov 12, 2024

Semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11854625B2Dec 26, 2023

Device and method for operating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11527630B2Dec 13, 2022

Semiconductor device and method for fabricating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12581871B2Mar 17, 2026

Phase-change material (PCM) radio frequency (RF) switching device with thin self-aligned dielectric layer

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12543513B2Feb 3, 2026

High-frequency, low-voltage switch devices and methods of manufacturing thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12217924B2Feb 4, 2025

Heat controlled switch

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11069652B2Jul 20, 2021

Method of manufacturing semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12225735B2Feb 11, 2025

Selector for memory device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US12527006B2Jan 13, 2026

Vertical 1T1R structure for embedded memory

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12490503B2Dec 2, 2025

Voltage regulator having variable output capacitance and methods for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12446228B2Oct 14, 2025

Memory device and method for fabricating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12419061B2Sep 16, 2025

Cross-point architecture for PCRAM

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12063785B2Aug 13, 2024

Integrated circuit, memory device and method of manufacturing the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12268103B2Apr 1, 2025

Phase change material switch with improved thermal confinement and methods for forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12453101B2Oct 21, 2025

Phase change material switch circuit for enhanced signal isolation and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US12443061B2Oct 14, 2025

Optical device with phase-change materials and method of fabricating the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10535629B2Jan 14, 2020

Method of manufacturing semiconductor structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9799625B2Oct 24, 2017

Semiconductor structure and manufacturing method thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50

CHANG KUO-PIN

4 patents

CHIEN WEI-CHIH

1 patent

(unassigned)

1 patent

MACRONIC INTERNAT CO LTD

1 patent

LUE HANG-TING

1 patent

Showing the top 50 of 52 patents by PatentIndex Score.