Inventor
CHANG KUO-PIN
TW52 patents
⚠️ This page may combine multiple inventors who share the name “CHANG KUO-PIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MACRONIX INT CO LTD
21 patentsUS7777215B2Aug 17, 2010
Resistive memory structure with buffer layer
MACRONIX INT CO LTD57 citations98
US9620217B2Apr 11, 2017
Sub-block erase
MACRONIX INT CO LTD24 citations94
US7960224B2Jun 14, 2011
Operation method for multi-level switching of metal-oxide based RRAM
MACRONIX INT CO LTD21 citations93
US10593697B1Mar 17, 2020
Memory device
MACRONIX INT CO LTD15 citations86
US9721668B2Aug 1, 2017
3D non-volatile memory array with sub-block erase architecture
MACRONIX INT CO LTD12 citations84
US9530503B2Dec 27, 2016
And-type SGVC architecture for 3D NAND flash
MACRONIX INT CO LTD7 citations84
US7943920B2May 17, 2011
Resistive memory structure with buffer layer
MACRONIX INT CO LTD10 citations84
US9685233B2Jun 20, 2017
Programming multibit memory cells
MACRONIX INT CO LTD11 citations83
US8760928B2Jun 24, 2014
NAND flash biasing operation
MACRONIX INT CO LTD13 citations83
US9171636B2Oct 27, 2015
Hot carrier generation and programming in NAND flash
MACRONIX INT CO LTD9 citations81
US10811427B1Oct 20, 2020
Semiconductor structure and manufacturing method thereof
MACRONIX INT CO LTD4 citations73
US9761319B1Sep 12, 2017
Reading method for preventing read disturbance and memory using the same
MACRONIX INT CO LTD2 citations73
US9607702B2Mar 28, 2017
Sub-block page erase in 3D p-channel flash memory
MACRONIX INT CO LTD5 citations73
US9466384B1Oct 11, 2016
Memory device and associated erase method
MACRONIX INT CO LTD5 citations73
US9373409B2Jun 21, 2016
Systems and methods for reduced program disturb for 3D NAND flash
MACRONIX INT CO LTD3 citations70
US9520199B2Dec 13, 2016
Memory device and reading method thereof
MACRONIX INT CO LTD2 citations63
US9361989B1Jun 7, 2016
Memory device and data erasing method thereof
MACRONIX INT CO LTD2 citations63
US9490017B2Nov 8, 2016
Forced-bias method in sub-block erase
MACRONIX INT CO LTD2 citations60
US10886222B2Jan 5, 2021
Via contact, memory device, and method of forming semiconductor structure
MACRONIX INT CO LTD0 citations52
US9747989B1Aug 29, 2017
Memory device and control method thereof
MACRONIX INT CO LTD1 citations52
US9305653B1Apr 5, 2016
Memory array and operating method of same
MACRONIX INT CO LTD1 citations52
TAIWAN SEMICONDUCTOR MFG CO LTD
21 patentsUS10878915B1Dec 29, 2020
Memory device and method for programming the same
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10163849B2Dec 25, 2018
Method of manufacturing semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12308078B2May 20, 2025
One-time programmable (OTP) memory and method of operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12142653B2Nov 12, 2024
Semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11854625B2Dec 26, 2023
Device and method for operating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US11527630B2Dec 13, 2022
Semiconductor device and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12581871B2Mar 17, 2026
Phase-change material (PCM) radio frequency (RF) switching device with thin self-aligned dielectric layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12543513B2Feb 3, 2026
High-frequency, low-voltage switch devices and methods of manufacturing thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12217924B2Feb 4, 2025
Heat controlled switch
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11069652B2Jul 20, 2021
Method of manufacturing semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US12225735B2Feb 11, 2025
Selector for memory device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US12527006B2Jan 13, 2026
Vertical 1T1R structure for embedded memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12490503B2Dec 2, 2025
Voltage regulator having variable output capacitance and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12446228B2Oct 14, 2025
Memory device and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12419061B2Sep 16, 2025
Cross-point architecture for PCRAM
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12063785B2Aug 13, 2024
Integrated circuit, memory device and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US12268103B2Apr 1, 2025
Phase change material switch with improved thermal confinement and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US12453101B2Oct 21, 2025
Phase change material switch circuit for enhanced signal isolation and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US12443061B2Oct 14, 2025
Optical device with phase-change materials and method of fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US10535629B2Jan 14, 2020
Method of manufacturing semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US9799625B2Oct 24, 2017
Semiconductor structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
CHANG KUO-PIN
4 patentsUS8134865B2Mar 13, 2012
Operating method of electrical pulse voltage for RRAM application
CHANG KUO-PIN7 citations83
US8501574B2Aug 6, 2013
Resistive memory device and manufacturing method thereof and operating method thereof
CHANG KUO-PIN2 citations62
US8284597B2Oct 9, 2012
Diode memory
CHANG KUO-PIN3 citations62
US8274065B2Sep 25, 2012
Memory and method of fabricating the same
CHANG KUO-PIN3 citations62
CHIEN WEI-CHIH
1 patent(unassigned)
1 patentMACRONIC INTERNAT CO LTD
1 patentLUE HANG-TING
1 patentShowing the top 50 of 52 patents by PatentIndex Score.