P

Inventor

WU CHENG-WEN

TW27 patents
⚠️ This page may combine multiple inventors who share the name “WU CHENG-WEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAT UNIV TSING HUA

5 patents
US7904768B2Mar 8, 2011

Probing system for integrated circuit devices

NAT UNIV TSING HUA11 citations82
US7859900B2Dec 28, 2010

Built-in self-repair method for NAND flash memory and system thereof

NAT UNIV TSING HUA8 citations80
US8977942B2Mar 10, 2015

Data error-detection system and data error-detection method thereof

NAT UNIV TSING HUA12 citations76
US8742839B2Jun 3, 2014

Double through silicon via structure

NAT UNIV TSING HUA2 citations55
US8937486B2Jan 20, 2015

Method for testing through-silicon-via

NAT UNIV TSING HUA0 citations51

IND TECH RES INST

4 patents
US7228468B2Jun 5, 2007

Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification

IND TECH RES INST28 citations90
US7644323B2Jan 5, 2010

Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification

IND TECH RES INST11 citations82
US7319625B2Jan 15, 2008

Built-in memory current test circuit

IND TECH RES INST15 citations81
US9905277B2Feb 27, 2018

Memory controlling method and memory system

IND TECH RES INST0 citations35

GLOBAL UNICHIP CORP

2 patents
US6415403B1Jul 2, 2002

Programmable built in self test for embedded DRAM

GLOBAL UNICHIP CORP83 citations95
US6934900B1Aug 23, 2005

Test pattern generator for SRAM and DRAM

GLOBAL UNICHIP CORP62 citations94

WU CHENG WEN

2 patents
US8307261B2Nov 6, 2012

Non-volatile memory management method

WU CHENG WEN10 citations78
US8531199B2Sep 10, 2013

Method for testing through-silicon-via and the circuit thereof

WU CHENG WEN4 citations60

UNIV TSINGHUA

2 patents
US7675309B2Mar 9, 2010

Probing system for integrated circuit device

UNIV TSINGHUA7 citations71
US7117409B2Oct 3, 2006

Multi-port memory testing method utilizing a sequence folding scheme for testing time reduction

UNIV TSINGHUA3 citations56

FARADAY TECH CORP

2 patents
US6529430B2Mar 4, 2003

Built-in programmable self-diagnostic circuit for SRAM unit

FARADAY TECH CORP4 citations59
US6459638B1Oct 1, 2002

Built-in programmable self-diagnostic circuit for SRAM unit

FARADAY TECH CORP5 citations59

ACADEMIA SINICA

1 patent
US6218114B1Apr 17, 2001

Methods for detecting differentially expressed genes

ACADEMIA SINICA59 citations93

NAT SCIENCE COUNCIL OF R O C

1 patent
US5570375AOct 29, 1996

IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing

NAT SCIENCE COUNCIL OF R O C140 citations91

NAT SCIENCE COUNCIL

1 patent
US6181840B1Jan 30, 2001

Reflectivity-tunable fiber optic reflector

NAT SCIENCE COUNCIL19 citations90

UNIV TSING HUA

1 patent
US7065689B2Jun 20, 2006

Diagonal testing method for flash memories

UNIV TSING HUA19 citations86

WU CHENG-WEN

1 patent
US8160413B2Apr 17, 2012

Fiber optic coupler with variable coupling ratio and manufacturing method thereof

WU CHENG-WEN2 citations61

NAT HEALTH RESEARCH INSTITUTES

1 patent
US7507534B2Mar 24, 2009

Rapid efficacy assessment method for lung cancer therapy

NAT HEALTH RESEARCH INSTITUTES2 citations58

UNIV NAT TAIWAN

1 patent
US7354709B2Apr 8, 2008

Collapsin response mediator protein-1

UNIV NAT TAIWAN6 citations58

LEE MINCENT

1 patent
US8095832B2Jan 10, 2012

Method for repairing memory and system thereof

LEE MINCENT2 citations54

NAT HEALTH RESEARCH INST

1 patent
US5939428AAug 17, 1999

Alkyl N- 3-(acridin-9-yl)amino-5-hydroxymethyl! phenylcarbamates

NAT HEALTH RESEARCH INST6 citations53

WANG CHEN HSING

1 patent
US8443032B2May 14, 2013

Multiplication circuit and de/encryption circuit utilizing the same

WANG CHEN HSING0 citations30