Inventor

HO JUNG-CHI

TW4 patents

⚠️ This page may combine multiple inventors who share the name “HO JUNG-CHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IND TECH RES INST

2 patents

US7319625B2Jan 15, 2008

Built-in memory current test circuit

IND TECH RES INST15 citations81

US6950046B2Sep 27, 2005

IC with built-in self-test and design method thereof

IND TECH RES INST4 citations60

FARADAY TECH CORP

2 patents

US8054101B2Nov 8, 2011

Current source applicable to a controllable delay line and design method thereof

FARADAY TECH CORP2 citations56

US7945404B2May 17, 2011

Clock jitter measurement circuit and integrated circuit having the same

FARADAY TECH CORP4 citations55