Inventor

MAAYAH KAIS

US5 patents

⚠️ This page may combine multiple inventors who share the name “MAAYAH KAIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KLA TENCOR TECH CORP

2 patents

US7676077B2Mar 9, 2010

Methods and systems for utilizing design data in combination with inspection data

KLA TENCOR TECH CORP277 citations98

US8041103B2Oct 18, 2011

Methods and systems for determining a position of inspection data in design data space

KLA TENCOR TECH CORP85 citations97

KULKARNI ASHOK

1 patent

US8139843B2Mar 20, 2012

Methods and systems for utilizing design data in combination with inspection data

KULKARNI ASHOK55 citations95

KLA TENCOR CORP

1 patent

US7796804B2Sep 14, 2010

Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer

KLA TENCOR CORP25 citations91

BHASKAR KRIS

1 patent

US8204296B2Jun 19, 2012

Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a wafer

BHASKAR KRIS15 citations81