Inventor
KRISHNAN SRIKANTH
US26 patents
⚠️ This page may combine multiple inventors who share the name “KRISHNAN SRIKANTH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
23 patentsUS6399445B1Jun 4, 2002
Fabrication technique for controlled incorporation of nitrogen in gate dielectric
TEXAS INSTRUMENTS INC51 citations92
US6396075B1May 28, 2002
Transient fuse for change-induced damage detection
TEXAS INSTRUMENTS INC18 citations92
US6117745ASep 12, 2000
Bistable fuse by amorphization of polysilicon
TEXAS INSTRUMENTS INC22 citations92
US5998299ADec 7, 1999
Protection structures for the suppression of plasma damage
TEXAS INSTRUMENTS INC37 citations92
US5596207AJan 21, 1997
Apparatus and method for detecting defects in insulative layers of MOS active devices
TEXAS INSTRUMENTS INC22 citations92
US5994742ANov 30, 1999
Plasma emission triggered protection device for protecting against charge-induced damage
TEXAS INSTRUMENTS INC30 citations91
US7212023B2May 1, 2007
System and method for accurate negative bias temperature instability characterization
TEXAS INSTRUMENTS INC17 citations90
US6016062AJan 18, 2000
Process related damage monitor (predator)--systematic variation of antenna parameters to determine charge damage
TEXAS INSTRUMENTS INC35 citations86
US7218132B2May 15, 2007
System and method for accurate negative bias temperature instability characterization
TEXAS INSTRUMENTS INC12 citations81
US7808266B2Oct 5, 2010
Method and apparatus for evaluating the effects of stress on an RF oscillator
TEXAS INSTRUMENTS INC9 citations76
US5739052AApr 14, 1998
Apparatus and method for detecting defects in insulative layers of MOS active devices
TEXAS INSTRUMENTS INC12 citations74
US9476933B2Oct 25, 2016
Apparatus and methods for qualifying HEMT FET devices
TEXAS INSTRUMENTS INC6 citations73
US7122466B2Oct 17, 2006
Two step semiconductor manufacturing process for copper interconnects
TEXAS INSTRUMENTS INC4 citations63
US6586267B2Jul 1, 2003
Transient fuse for charge-induced damage detection
TEXAS INSTRUMENTS INC4 citations63
US7750400B2Jul 6, 2010
Integrated circuit modeling, design, and fabrication based on degradation mechanisms
TEXAS INSTRUMENTS INC2 citations62
US6962883B2Nov 8, 2005
Integrated circuit insulator and method
TEXAS INSTRUMENTS INC4 citations62
US6770937B1Aug 3, 2004
Photoconductive thin film for reduction of plasma damage
TEXAS INSTRUMENTS INC2 citations62
US7974595B2Jul 5, 2011
Methodology for assessing degradation due to radio frequency excitation of transistors
TEXAS INSTRUMENTS INC6 citations61
US7638412B2Dec 29, 2009
Method and system for reducing charge damage in silicon-on-insulator technology
TEXAS INSTRUMENTS INC0 citations51
US7262468B2Aug 28, 2007
Method and system for reducing charge damage in silicon-on-insulator technology
TEXAS INSTRUMENTS INC1 citations51
US7071092B2Jul 4, 2006
Method of manufacturing antenna proximity lines
TEXAS INSTRUMENTS INC0 citations51
US7031163B2Apr 18, 2006
Mechanical cooling fin for interconnects
TEXAS INSTRUMENTS INC1 citations51
US6969902B2Nov 29, 2005
Integrated circuit having antenna proximity lines coupled to the semiconductor substrate contacts
TEXAS INSTRUMENTS INC1 citations51