Inventor
HAMRICK DANIEL R
US14 patents
⚠️ This page may combine multiple inventors who share the name “HAMRICK DANIEL R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AMO WAVEFRONT SCIENCES LLC
9 patentsUS10582847B2Mar 10, 2020
Method and system for eye measurements and cataract surgery planning using vector function derived from prior surgeries
AMO WAVEFRONT SCIENCES LLC5 citations72
US10582846B2Mar 10, 2020
Method and system for eye measurements and cataract surgery planning using vector function derived from prior surgeries
AMO WAVEFRONT SCIENCES LLC2 citations72
US10583039B2Mar 10, 2020
Method and system for eye measurements and cataract surgery planning using vector function derived from prior surgeries
AMO WAVEFRONT SCIENCES LLC6 citations72
US10456026B2Oct 29, 2019
Apparatus, system, and method for intraocular lens power calculation using a regression formula incorporating corneal spherical aberration
AMO WAVEFRONT SCIENCES LLC1 citations62
US10085634B2Oct 2, 2018
Systems and methods of optical coherence tomography with a multi-focal delay line
AMO WAVEFRONT SCIENCES LLC0 citations51
US10149613B2Dec 11, 2018
Wavefront interactive refraction display
AMO WAVEFRONT SCIENCES LLC0 citations50
US9713421B2Jul 25, 2017
Wavefront interactive refraction display
AMO WAVEFRONT SCIENCES LLC0 citations50
US10119803B2Nov 6, 2018
Signal extraction systems and methods
AMO WAVEFRONT SCIENCES LLC0 citations48
US9468369B2Oct 18, 2016
Model eye producing a speckle pattern having a reduced bright-to-dark ratio for use with optical measurement system for cataract diagnostics
AMO WAVEFRONT SCIENCES LLC0 citations41
WAVEFRONT SCIENCES INC
3 patentsUS6819413B2Nov 16, 2004
Method and system for sensing and analyzing a wavefront of an optically transmissive system
WAVEFRONT SCIENCES INC55 citations94
US6547395B1Apr 15, 2003
Methods of measuring moving objects and reducing exposure during wavefront measurements
WAVEFRONT SCIENCES INC41 citations88
US6624896B1Sep 23, 2003
System and method for metrology of surface flatness and surface nanotopology of materials
WAVEFRONT SCIENCES INC14 citations84