Inventor
ANAI TETSUJI
JP42 patents
⚠️ This page may combine multiple inventors who share the name “ANAI TETSUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
31 patentsUS7747151B2Jun 29, 2010
Image processing device and method
TOPCON CORP54 citations94
US9007461B2Apr 14, 2015
Aerial photograph image pickup method and aerial photograph image pickup apparatus
TOPCON CORP21 citations93
US7860273B2Dec 28, 2010
Device and method for position measurement
TOPCON CORP36 citations93
US7844077B2Nov 30, 2010
Location measuring device and method
TOPCON CORP25 citations93
US7860302B2Dec 28, 2010
Image processing apparatus
TOPCON CORP21 citations92
US7726033B2Jun 1, 2010
Multi-point measuring method and surveying device
TOPCON CORP19 citations91
US10921430B2Feb 16, 2021
Surveying system
TOPCON CORP8 citations84
US10520307B2Dec 31, 2019
Surveying instrument
TOPCON CORP10 citations84
US9897436B2Feb 20, 2018
Measuring instrument and surveying system
TOPCON CORP8 citations84
US8953933B2Feb 10, 2015
Aerial photogrammetry and aerial photogrammetric system
TOPCON CORP18 citations84
US7860276B2Dec 28, 2010
Image processing device and method
TOPCON CORP17 citations84
US7747150B2Jun 29, 2010
Image processing device and method
TOPCON CORP14 citations84
US11421989B2Aug 23, 2022
Surveying instrument
TOPCON CORP2 citations73
US11333496B2May 17, 2022
Surveying instrument
TOPCON CORP5 citations73
US11193765B2Dec 7, 2021
Surveying instrument and photogrammetric method
TOPCON CORP2 citations73
US10281580B2May 7, 2019
Surveying system
TOPCON CORP5 citations73
US10198632B2Feb 5, 2019
Survey data processing device, survey data processing method, and survey data processing program
TOPCON CORP2 citations73
US9228858B2Jan 5, 2016
Rotation angle detecting apparatus
TOPCON CORP3 citations73
US9171225B2Oct 27, 2015
Device, method, and recording medium for detecting and removing mistracked points in visual odometry systems
TOPCON CORP6 citations73
US11598637B2Mar 7, 2023
Surveying instrument
TOPCON CORP1 citations63
US11150346B2Oct 19, 2021
Measuring method and laser scanner
TOPCON CORP0 citations63
US8836930B2Sep 16, 2014
Rotation angle detecting apparatus and surveying instrument
TOPCON CORP3 citations63
US7787689B2Aug 31, 2010
Location measuring device and method
TOPCON CORP3 citations63
US11630208B2Apr 18, 2023
Measurement system, measurement method, and measurement program
TOPCON CORP0 citations52
US11598874B2Mar 7, 2023
Surveying instrument and surveying instrument system
TOPCON CORP0 citations52
US11512957B2Nov 29, 2022
Surveying instrument
TOPCON CORP0 citations52
US11415414B2Aug 16, 2022
Surveying instrument
TOPCON CORP0 citations52
US11402207B2Aug 2, 2022
Surveying instrument
TOPCON CORP0 citations52
US10048063B2Aug 14, 2018
Measuring instrument and surveying system
TOPCON CORP1 citations52
US8937278B2Jan 20, 2015
Rotation angle detecting apparatus
TOPCON CORP1 citations52
US11293754B2Apr 5, 2022
Surveying instrument
TOPCON CORP0 citations51
KK TOPCON
7 patentsUS9409656B2Aug 9, 2016
Aerial photographing system
KK TOPCON22 citations93
US9648304B2May 9, 2017
Image pickup method and photographing device
KK TOPCON2 citations73
US9571794B2Feb 14, 2017
Surveying apparatus
KK TOPCON2 citations73
US9736360B2Aug 15, 2017
Survey data processing device, survey data processing method, and program therefor
KK TOPCON6 citations72
US10331972B2Jun 25, 2019
Survey data processing device, survey data processing method, and program therefor
KK TOPCON1 citations61
US9541382B2Jan 10, 2017
Rotation angle detecting apparatus and surveying instrument
KK TOPCON0 citations42
US9911038B2Mar 6, 2018
Survey data processing device, survey data processing method, and program therefor
KK TOPCON0 citations40