Inventor

LIM JAEHYOUNG

KR3 patents

Patents

3 patents

US11223344B2Jan 11, 2022

Scan flip-flop, flip-flop and scan test circuit including the same

SAMSUNG ELECTRONICS CO LTD2 citations70

US11848382B2Dec 19, 2023

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations57

US11322616B2May 3, 2022

Semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations57