Inventor

SHIAU YING

US13 patents

Patents

13 patents

US5787190AJul 28, 1998

Method and apparatus for pattern recognition of wafer test bins

ADVANCED MICRO DEVICES INC230 citations97

US5761064AJun 2, 1998

Defect management system for productivity and yield improvement

ADVANCED MICRO DEVICES INC243 citations97

US5930138AJul 27, 1999

Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs

ADVANCED MICRO DEVICES INC85 citations96

US5726920AMar 10, 1998

Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line

ADVANCED MICRO DEVICES INC158 citations96

US5896294AApr 20, 1999

Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring

ADVANCED MICRO DEVICES INC145 citations94

US5598341AJan 28, 1997

Real-time in-line defect disposition and yield forecasting system

ADVANCED MICRO DEVICES INC82 citations94

US6001663ADec 14, 1999

Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same

ADVANCED MICRO DEVICES INC46 citations92

US5821765AOct 13, 1998

Apparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the same

ADVANCED MICRO DEVICES INC20 citations92

US5761065AJun 2, 1998

Arrangement and method for detecting sequential processing effects in manufacturing

ADVANCED MICRO DEVICES INC61 citations92

US5716856AFeb 10, 1998

Arrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runs

ADVANCED MICRO DEVICES INC17 citations92

US5822717AOct 13, 1998

Method and apparatus for automated wafer level testing and reliability data analysis

ADVANCED MICRO DEVICES INC34 citations89

US5670891ASep 23, 1997

Structures to extract defect size information of poly and source-drain semiconductor devices and method for making the same

ADVANCED MICRO DEVICES INC16 citations82

US5963780AOct 5, 1999

Method for detecting defect sizes in polysilicon and source-drain semiconductor devices

ADVANCED MICRO DEVICES INC5 citations74