Inventor

TANIMOTO SHIGERU

JP2 patents

Patents

2 patents

US4885528ADec 5, 1989

Apparatus which uses a simulated inductor in the measurement of an electrical parameter of a device under test

HEWLETT PACKARD CO19 citations70

US5019781AMay 28, 1991

Source level control for impedance meter

HEWLETT PACKARD CO6 citations58