Inventor

LUEPKE JENS

DE17 patents

⚠️ This page may combine multiple inventors who share the name “LUEPKE JENS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LUEPKE JENS

INFINEON TECHNOLOGIES AG

System for testing fast synchronous semiconductor circuits

Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

System for testing fast integrated digital circuits, in particular semiconductor memory modules

Field-effect-controlled transistor and method for fabricating the transistor

Component holder for testing devices and component holder system microlithography

Test circuit for testing a synchronous memory circuit

Test circuit for testing a circuit

System for testing fast synchronous digital circuits, particularly semiconductor memory chips

Test data generator

Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits

Method and device for testing semiconductor memory devices

Method of testing a memory cell having a floating gate

Method and device for generating digital signal patterns

Address generator for generating addresses for testing a circuit

(unassigned)

Test circuit

SIEMENS AG

Burn-in test device