P

Inventor

SCHITTENHELM MICHAEL

DE16 patents
⚠️ This page may combine multiple inventors who share the name “SCHITTENHELM MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INFINEON TECHNOLOGIES AG

15 patents
US6556492B2Apr 29, 2003

System for testing fast synchronous semiconductor circuits

INFINEON TECHNOLOGIES AG31 citations92
US6871306B2Mar 22, 2005

Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

INFINEON TECHNOLOGIES AG12 citations84
US6721904B2Apr 13, 2004

System for testing fast integrated digital circuits, in particular semiconductor memory modules

INFINEON TECHNOLOGIES AG15 citations84
US6515319B2Feb 4, 2003

Field-effect-controlled transistor and method for fabricating the transistor

INFINEON TECHNOLOGIES AG17 citations82
US7117404B2Oct 3, 2006

Test circuit for testing a synchronous memory circuit

INFINEON TECHNOLOGIES AG8 citations73
US6618305B2Sep 9, 2003

Test circuit for testing a circuit

INFINEON TECHNOLOGIES AG8 citations73
US6897646B2May 24, 2005

Method for testing wafers to be tested and calibration apparatus

INFINEON TECHNOLOGIES AG11 citations69
US7062690B2Jun 13, 2006

System for testing fast synchronous digital circuits, particularly semiconductor memory chips

INFINEON TECHNOLOGIES AG3 citations62
US6865707B2Mar 8, 2005

Test data generator

INFINEON TECHNOLOGIES AG6 citations62
US6862702B2Mar 1, 2005

Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

INFINEON TECHNOLOGIES AG3 citations62
US6839397B2Jan 4, 2005

Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits

INFINEON TECHNOLOGIES AG3 citations62
US6724181B2Apr 20, 2004

Method of calibrating a test system for semiconductor components, and test substrate

INFINEON TECHNOLOGIES AG4 citations62
US7426669B2Sep 16, 2008

Circuit arrangement and method for driving electronic chips

INFINEON TECHNOLOGIES AG0 citations50
US7117403B2Oct 3, 2006

Method and device for generating digital signal patterns

INFINEON TECHNOLOGIES AG0 citations41
US6957373B2Oct 18, 2005

Address generator for generating addresses for testing a circuit

INFINEON TECHNOLOGIES AG0 citations41

(unassigned)

1 patent
US6744272B2Jun 1, 2004

Test circuit

25 citations92