Inventor
GUETTAF AMAR
US16 patents
⚠️ This page may combine multiple inventors who share the name “GUETTAF AMAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BROADCOM CORP
13 patentsUS7058868B2Jun 6, 2006
Scan testing mode control of gated clock signals for memory devices
BROADCOM CORP48 citations92
US7500165B2Mar 3, 2009
Systems and methods for controlling clock signals during scan testing integrated circuits
BROADCOM CORP12 citations83
US7441164B2Oct 21, 2008
Memory bypass with support for path delay test
BROADCOM CORP13 citations83
US7131045B2Oct 31, 2006
Systems and methods for scan test access using bond pad test access circuits
BROADCOM CORP13 citations83
US7089471B2Aug 8, 2006
Scan testing mode control of gated clock signals for flip-flops
BROADCOM CORP14 citations83
US7032202B2Apr 18, 2006
System and method for implementing a flexible top level scan architecture using a partitioning algorithm to balance the scan chains
BROADCOM CORP10 citations73
US7424417B2Sep 9, 2008
System and method for clock domain grouping using data path relationships
BROADCOM CORP3 citations62
US6968519B2Nov 22, 2005
System and method for using IDDQ pattern generation for burn-in tests
BROADCOM CORP4 citations62
US6822439B2Nov 23, 2004
Control of tristate buses during scan test
BROADCOM CORP2 citations59
US7581150B2Aug 25, 2009
Methods and computer program products for debugging clock-related scan testing failures of integrated circuits
BROADCOM CORP0 citations51
US7062693B2Jun 13, 2006
Methodology for selectively testing portions of an integrated circuit
BROADCOM CORP1 citations49
US7558722B2Jul 7, 2009
Debug method for mismatches occurring during the simulation of scan patterns
BROADCOM CORP0 citations41
US7395468B2Jul 1, 2008
Methods for debugging scan testing failures of integrated circuits
BROADCOM CORP0 citations41