Inventor

SUGAI KATSUSHI

JP3 patents

⚠️ This page may combine multiple inventors who share the name “SUGAI KATSUSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UMEMURA YOSHIHARU

1 patent

US8779791B2Jul 15, 2014

Method of manufacturing probe having boards connected by magnets

UMEMURA YOSHIHARU2 citations56

MATSUMURA SHIGERU

1 patent

US8922232B2Dec 30, 2014

Test-use individual substrate, probe, and semiconductor wafer testing apparatus

MATSUMURA SHIGERU2 citations53

ADVANTEST CORP

1 patent

US9176169B2Nov 3, 2015

Probe apparatus and test apparatus

ADVANTEST CORP1 citations43