Inventor

BRAUER BJORN

US45 patents

⚠️ This page may combine multiple inventors who share the name “BRAUER BJORN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BRAUER BJORN

KLA TENCOR CORP

Convolutional neural network-based mode selection and defect classification for image fusion

Accelerating semiconductor-related computations using learning based models

Training a learning based defect classifier

Identifying a source of nuisance defects on a wafer

High sensitivity repeater defect detection

Optical mode analysis with design-based care areas

Algorithm selector based on image frames

Performance monitoring of design-based alignment

Wafer noise reduction by image subtraction across layers

Combined patch and design-based defect detection

Defect signal to noise enhancement by reducing die to die process noise

Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data

Capture of repeater defects on a semiconductor wafer

Inspection for specimens with extensive die to die process variation

Optical-mode selection for multi-mode semiconductor inspection

Dynamic care areas for defect detection

Repeater defect detection

Systems and methods for region-adaptive defect detection

Data augmentation for convolutional neural network-based defect inspection

Tool health monitoring and matching

Cross layer common-unique analysis for nuisance filtering

Cross layer common-unique analysis for nuisance filtering

Combining simulation and optical microscopy to determine inspection mode

Defect classification by fitting optical signals to a point-spread function

Repeater defect detection

Defect-location determination using correction loop for pixel alignment

Nuisance reduction using location-based attributes

KLA CORP

Generative adversarial networks (GANs) for simulating specimen images

Controlling a process for inspection of a specimen

Deep generative models for optical or other mode selection

Pattern-to-design alignment for one-dimensional unique structures

File selection for test image to design alignment

Unsupervised learning-based reference selection for enhanced defect inspection sensitivity

Statistical learning-based mode selection for multi-mode inspection

Semantic image segmentation for semiconductor-based applications

Setting up inspection of a specimen

Image alignment setup for specimens with intra- and inter-specimen variations using unsupervised learning and adaptive database generation methods

System and method for inspection using tensor decomposition and singular value decomposition

Clustering sub-care areas based on noise characteristics

Multi-imaging mode image alignment

Image contrast metrics for deriving and improving imaging conditions

Deep generative model-based alignment for semiconductor applications

Selecting defect detection methods for inspection of a specimen

Print check repeater defect detection

KLA—TENCOR CORP

Previous layer nuisance reduction through oblique illumination