Inventor
PRADEEP WILSON
IN21 patents
⚠️ This page may combine multiple inventors who share the name “PRADEEP WILSON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
20 patentsUS10579454B2Mar 3, 2020
Delay fault testing of pseudo static controls
TEXAS INSTRUMENTS INC8 citations82
US10184980B2Jan 22, 2019
Multiple input signature register analysis for digital circuitry
TEXAS INSTRUMENTS INC7 citations81
US11604221B1Mar 14, 2023
Clock shaper circuit for transition fault testing
TEXAS INSTRUMENTS INC5 citations80
US11073553B2Jul 27, 2021
Dynamic generation of ATPG mode signals for testing multipath memory circuit
TEXAS INSTRUMENTS INC2 citations72
US11073557B2Jul 27, 2021
Phase controlled codec block scan of a partitioned circuit device
TEXAS INSTRUMENTS INC3 citations72
US10776546B2Sep 15, 2020
False path timing exception handler circuit
TEXAS INSTRUMENTS INC1 citations72
US10331826B2Jun 25, 2019
False path timing exception handler circuit
TEXAS INSTRUMENTS INC2 citations72
US9535123B2Jan 3, 2017
Frequency scaled segmented scan chain for integrated circuits
TEXAS INSTRUMENTS INC4 citations71
US11680984B1Jun 20, 2023
Control data registers for scan testing
TEXAS INSTRUMENTS INC2 citations70
US11209481B2Dec 28, 2021
Multiple input signature register analysis for digital circuitry
TEXAS INSTRUMENTS INC2 citations70
US11333707B2May 17, 2022
Testing of integrated circuits during at-speed mode of operation
TEXAS INSTRUMENTS INC3 citations67
US11933844B2Mar 19, 2024
Path based controls for ATE mode testing of multicell memory circuit
TEXAS INSTRUMENTS INC0 citations62
US11879940B2Jan 23, 2024
Dynamic generation of ATPG mode signals for testing multipath memory circuit
TEXAS INSTRUMENTS INC0 citations62
US11519964B2Dec 6, 2022
Phase controlled codec block scan of a partitioned circuit device
TEXAS INSTRUMENTS INC0 citations62
US11194944B2Dec 7, 2021
False path timing exception handler circuit
TEXAS INSTRUMENTS INC0 citations62
US11047910B2Jun 29, 2021
Path based controls for ATE mode testing of multicell memory circuit
TEXAS INSTRUMENTS INC0 citations62
US11768726B2Sep 26, 2023
Delay fault testing of pseudo static controls
TEXAS INSTRUMENTS INC0 citations60
US11194645B2Dec 7, 2021
Delay fault testing of pseudo static controls
TEXAS INSTRUMENTS INC0 citations60
US12216160B2Feb 4, 2025
Clock shaper circuit for transition fault testing
TEXAS INSTRUMENTS INC0 citations57
US10473717B2Nov 12, 2019
Methods and apparatus for test insertion points
TEXAS INSTRUMENTS INC0 citations51