Inventor
LACHENMANN SUSANNE
DE4 patents
Patents
4 patentsUS7372072B2May 13, 2008
Semiconductor wafer with test structure
INFINEON TECHNOLOGIES AG8 citations66
US6856562B2Feb 15, 2005
Test structure for measuring a junction resistance in a DRAM memory cell array
INFINEON TECHNOLOGIES AG3 citations58
US7126154B2Oct 24, 2006
Test structure for a single-sided buried strap DRAM memory cell array
INFINEON TECHNOLOGIES AG2 citations54
US7205567B2Apr 17, 2007
Semiconductor product having a semiconductor substrate and a test structure and method
INFINEON TECHNOLOGIES AG1 citations48