Inventor
ROSSKOPF VALENTIN
DE12 patents
Patents
12 patentsUS6930324B2Aug 16, 2005
Device architecture and process for improved vertical memory arrays
INFINEON TECHNOLOGIES AG99 citations96
US6853000B2Feb 8, 2005
Test structure for determining a doping region of an electrode connection between a trench capacitor and a selection transistor in a memory cell array
INFINEON TECHNOLOGIES AG7 citations72
US6838724B2Jan 4, 2005
Transistor array and semiconductor memory configuration fabricated with the transistor array
INFINEON TECHNOLOGIES AG9 citations72
US6529031B2Mar 4, 2003
Integrated circuit configuration for testing transistors, and a semiconductor wafer having such a circuit configuration
INFINEON TECHNOLOGIES AG7 citations72
US7372072B2May 13, 2008
Semiconductor wafer with test structure
INFINEON TECHNOLOGIES AG8 citations66
US6897077B2May 24, 2005
Test structure for determining a short circuit between trench capacitors in a memory cell array
INFINEON TECHNOLOGIES AG2 citations61
US6856562B2Feb 15, 2005
Test structure for measuring a junction resistance in a DRAM memory cell array
INFINEON TECHNOLOGIES AG3 citations58
US6484307B2Nov 19, 2002
Method for fabricating and checking structures of electronic circuits in a semiconductor substrate
INFINEON TECHNOLOGIES AG3 citations57
US7205567B2Apr 17, 2007
Semiconductor product having a semiconductor substrate and a test structure and method
INFINEON TECHNOLOGIES AG1 citations48
US6656647B2Dec 2, 2003
Method for examining structures on a wafer
INFINEON TECHNOLOGIES AG1 citations45
US6930325B2Aug 16, 2005
Test structure for improved vertical memory arrays
INFINEON TECHNOLOGIES AG0 citations40
US6878965B2Apr 12, 2005
Test structure for determining a region of a deep trench outdiffusion in a memory cell array
INFINEON TECHNOLOGIES AG0 citations40