Inventor
SUKMAN SIBINA
DE2 patents
Patents
2 patentsUS6917208B2Jul 12, 2005
Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuit
INFINEON TECHNOLOGIES AG6 citations58
US6856562B2Feb 15, 2005
Test structure for measuring a junction resistance in a DRAM memory cell array
INFINEON TECHNOLOGIES AG3 citations58