Inventor
HOLLE ARMIN
DE30 patents
⚠️ This page may combine multiple inventors who share the name “HOLLE ARMIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BRUKER DALTONIK GMBH
15 patentsUS6300627B1Oct 9, 2001
Daughter ion spectra with time-of-flight mass spectrometers
BRUKER DALTONIK GMBH57 citations96
US7989759B2Aug 2, 2011
Cleaned daughter ion spectra from maldi ionization
BRUKER DALTONIK GMBH25 citations92
US5886345AMar 23, 1999
Accurate mass determination with maldi time-of-flight mass spectrometers using internal reference substances
BRUKER DALTONIK GMBH31 citations92
US7235781B2Jun 26, 2007
Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis
BRUKER DALTONIK GMBH32 citations91
US6734421B2May 11, 2004
Time-of-flight mass spectrometer with multiplex operation
BRUKER DALTONIK GMBH14 citations84
US5910656AJun 8, 1999
Adjustment of the sample support in time-of-flight mass spectrometers
BRUKER DALTONIK GMBH19 citations84
US7408152B2Aug 5, 2008
Ion source using matrix-assisted laser desorption/ionization
BRUKER DALTONIK GMBH13 citations83
US7385192B2Jun 10, 2008
Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis
BRUKER DALTONIK GMBH15 citations83
US7989762B2Aug 2, 2011
Automatic cleaning of MALDI ion sources
BRUKER DALTONIK GMBH12 citations77
US7541597B2Jun 2, 2009
Automatic cleaning of ion sources
BRUKER DALTONIK GMBH8 citations76
US6723983B2Apr 20, 2004
High throughput of laser desorption mass spectra in time-of-flight mass spectrometers
BRUKER DALTONIK GMBH9 citations74
US6703608B2Mar 9, 2004
Method and apparatus for generating improved daughter-ion spectra using time-of-flight mass spectrometers
BRUKER DALTONIK GMBH12 citations74
US6717131B2Apr 6, 2004
Clean daughter-ion spectra using time-of-flight mass spectrometers
BRUKER DALTONIK GMBH11 citations66
US7301145B2Nov 27, 2007
Daughter ion spectra with time-of-flight mass spectrometers
BRUKER DALTONIK GMBH5 citations63
US7297942B2Nov 20, 2007
Method and device for cleaning desorption ion sources
BRUKER DALTONIK GMBH4 citations63
BRUKER FRANZEN ANALYTIK GMBH
6 patentsUS5742049AApr 21, 1998
Method of improving mass resolution in time-of-flight mass spectrometry
BRUKER FRANZEN ANALYTIK GMBH103 citations98
US5654545AAug 5, 1997
Mass resolution in time-of-flight mass spectrometers with reflectors
BRUKER FRANZEN ANALYTIK GMBH118 citations98
US5641959AJun 24, 1997
Method for improved mass resolution with a TOF-LD source
BRUKER FRANZEN ANALYTIK GMBH72 citations96
US5294797AMar 15, 1994
Method and apparatus for generating ions from thermally unstable, non-volatile, large molecules, particularly for a mass spectrometer such as a time-of-flight mass spectrometer
BRUKER FRANZEN ANALYTIK GMBH66 citations94
US5463218AOct 31, 1995
Detection of very large molecular ions in a time-of-flight mass spectrometer
BRUKER FRANZEN ANALYTIK GMBH23 citations92
US5841136ANov 24, 1998
Device and method for introduction of sample supports into a mass spectrometer
BRUKER FRANZEN ANALYTIK GMBH28 citations91
HOLLE ARMIN
4 patentsUS8294086B2Oct 23, 2012
Multiplexing daughter ion spectrum acquisition from MALDI ionization
HOLLE ARMIN7 citations83
US8536519B2Sep 17, 2013
Adjusting the detector amplification in mass spectrometers
HOLLE ARMIN6 citations72
US8274042B2Sep 25, 2012
Imaging mass spectrometry for small molecules in two-dimensional samples
HOLLE ARMIN2 citations62
US8872103B2Oct 28, 2014
Laser spot control in maldi mass spectrometers
HOLLE ARMIN2 citations61
SIKORA AG
4 patentsUS12055386B2Aug 6, 2024
Method and device for measuring a tubular strand
SIKORA AG1 citations61
US12461025B2Nov 4, 2025
Method and device for detecting defects of a strand-like product
SIKORA AG0 citations56
US12474264B2Nov 18, 2025
Method and device for determining the refractive index of a surface region of an object
SIKORA AG0 citations52
US12064911B2Aug 20, 2024
Method and device for measuring a tubular strand
SIKORA AG0 citations52