P

Inventor

VALLEY JOHN F

US9 patents
⚠️ This page may combine multiple inventors who share the name “VALLEY JOHN F”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALWAFERS CO LTD

4 patents
US12270768B2Apr 8, 2025

Method of processing a cleaved semiconductor wafer

GLOBALWAFERS CO LTD0 citations60
US12019031B2Jun 25, 2024

Cleaved semiconductor wafer imaging system

GLOBALWAFERS CO LTD0 citations60
US11921054B2Mar 5, 2024

Cleaved semiconductor wafer camera system

GLOBALWAFERS CO LTD0 citations60
US10636136B2Apr 28, 2020

Wafer nanotopography metrology for lithography based on thickness maps

GLOBALWAFERS CO LTD0 citations49

KLA TENCOR TECH CORP

1 patent
US7324917B2Jan 29, 2008

Method, system, and software for evaluating characteristics of a surface with reference to its edge

KLA TENCOR TECH CORP13 citations76

SUNEDISON SEMICONDUCTOR LTD UEN201334164H

1 patent
US10062158B2Aug 28, 2018

Wafer nanotopography metrology for lithography based on thickness maps

SUNEDISON SEMICONDUCTOR LTD UEN201334164H2 citations70

SUNEDISON SEMICONDUCTOR LTD (UEN201334164H)

1 patent
US9665931B2May 30, 2017

Air pocket detection methods and systems

SUNEDISON SEMICONDUCTOR LTD (UEN201334164H)4 citations70

MEMC ELECTRONIC MATERIALS

1 patent
US9317912B2Apr 19, 2016

Symmetry based air pocket detection methods and systems

MEMC ELECTRONIC MATERIALS1 citations49

SUNEDISON SEMICONDUCTOR LTD

1 patent
US10030964B2Jul 24, 2018

Systems and methods for performing phase shift interferometry while a wafer is vibrating

SUNEDISON SEMICONDUCTOR LTD1 citations45