Inventor
TSUNOKUNI KAZUYUKI
JP19 patents
⚠️ This page may combine multiple inventors who share the name “TSUNOKUNI KAZUYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
7 patentsUS6771077B2Aug 3, 2004
Method of testing electronic devices indicating short-circuit
HITACHI LTD85 citations98
US5661061AAug 26, 1997
Process for fabricating a semiconductor integrated circuit device having the multi-layered fin structure
HITACHI LTD48 citations91
US6895346B2May 17, 2005
Method for test conditions
HITACHI LTD10 citations73
US6780660B2Aug 24, 2004
System for testing electronic devices
HITACHI LTD9 citations73
US6770496B2Aug 3, 2004
Method of testing electronic devices
HITACHI LTD8 citations73
US6656752B1Dec 2, 2003
Ion current density measuring method and instrument, and semiconductor device manufacturing method
HITACHI LTD5 citations62
US6841405B2Jan 11, 2005
Photomask for test wafers
HITACHI LTD0 citations51
NIHON MICRONICS KK
6 patentsUS11245113B2Feb 8, 2022
Secondary battery
NIHON MICRONICS KK0 citations55
US10705151B2Jul 7, 2020
Intermediate structure unit for secondary cell and method for manufacturing secondary cell
NIHON MICRONICS KK0 citations51
US10090507B2Oct 2, 2018
Secondary battery-mounted circuit chip and manufacturing method thereof
NIHON MICRONICS KK0 citations50
US12170374B2Dec 17, 2024
Secondary battery
NIHON MICRONICS KK0 citations46
US9735594B2Aug 15, 2017
Charging/discharging device
NIHON MICRONICS KK0 citations40
US10686210B2Jun 16, 2020
Secondary battery mounted chip manufacturing method
NIHON MICRONICS KK0 citations33