Inventor

SAFRANI AVNER

IL17 patents

⚠️ This page may combine multiple inventors who share the name “SAFRANI AVNER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAFRANI AVNER

KLA CORP

Single grab overlay measurement of tall targets

System and method for determining target feature focus in image-based overlay metrology

System and method for determining target feature focus in image-based overlay metrology

Active reticle carrier for in situ stage correction

Imaging system for buried metrology targets

3D profilometry with a Linnik interferometer

High contrast imaging in bonded sample metrology using oblique illumination

Automatic teaching of substrate handling for production and process-control tools

KLA TENCOR CORP

Dual-interferometry wafer thickness gauge

System and method for photomask alignment and orientation characterization based on notch detection

B G NEGEV TECHNOLOGIES AND APPLICATIONS LTD AT BEN GURION UNIV

Real time dual mode full-field optical coherence microscopy with full range imaging

SWIR to visible up-conversion optical system

PHOTONICSYS LTD

Multiple wavelengths real time phase shift interference microscopy

UNIV BEN GURION

True-spectroscopic dual mode high resolution full-field optical coherence tomography using liquid crystal devices

ZALITZKY YESHAYAHU

Handling excess optical fiber

SAFRANI AVNER

Polarization-based optical switching

TELISWITCH SOLUTIONS LTD

Mechanical optical switch