Inventor
CHUANG KUN-TSANG
TW57 patents
Patents
50 patentsUS11335638B2May 17, 2022
Reducing RC delay in semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10790391B2Sep 29, 2020
Source/drain epitaxial layer profile
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10546937B2Jan 28, 2020
Structures and methods for noise isolation in semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations84
US12027581B2Jul 2, 2024
Semiconductor device with air-void in spacer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11942547B2Mar 26, 2024
Source/drain epitaxial layer profile
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11817345B2Nov 14, 2023
Multiple thickness semiconductor-on-insulator field effect transistors and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11804439B2Oct 31, 2023
Reducing RC delay in semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11462642B2Oct 4, 2022
Source/drain epitaxial layer profile
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11404537B2Aug 2, 2022
Semiconductor device with air-void in spacer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11367778B2Jun 21, 2022
MOSFET device structure with air-gaps in spacer and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11211283B2Dec 28, 2021
Method for forming a bulk semiconductor substrate configured to exhibit soi behavior
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10886165B2Jan 5, 2021
Method of forming negatively sloped isolation structures
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10672795B2Jun 2, 2020
Bulk semiconductor substrate configured to exhibit semiconductor-on-insulator behavior
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10163641B2Dec 25, 2018
Memory with a raised dummy feature surrounding a cell region
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US9728543B1Aug 8, 2017
Semiconductor structure and fabricating method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11887987B2Jan 30, 2024
Semiconductor wafer with devices having different top layer thicknesses
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US9825046B2Nov 21, 2017
Flash memory device having high coupling ratio
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11430733B2Aug 30, 2022
Method of testing wafer
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US11417749B2Aug 16, 2022
Semiconductor arrangement with airgap and method of forming
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10818595B2Oct 27, 2020
Semiconductor structure, testing and fabricating methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US9947759B1Apr 17, 2018
Semiconductor device having milti-height structure and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US12557346B2Feb 17, 2026
Source/drain epitaxial layer profile
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12464714B2Nov 4, 2025
Semiconductor device having non-continuous wall structure surrounding a stacked gate structure including a conductive layer disposed between segmented portions of the wall structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12446289B2Oct 14, 2025
MOSFET device structure with air-gaps in spacer and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12230574B2Feb 18, 2025
Reducing RC delay in semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12211934B2Jan 28, 2025
Semiconductor structure and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12199181B2Jan 14, 2025
Semiconductor structure and method for manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12191196B2Jan 7, 2025
Method of manufacturing a metal-oxide-semiconductor field-effect transistor (MOSFET) having low off-state capacitance
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11925017B2Mar 5, 2024
Semiconductor device having a wall structure surrounding a stacked gate structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11855170B2Dec 26, 2023
MOSFET device structure with air-gaps in spacer and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11594449B2Feb 28, 2023
Method of making a semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11476157B2Oct 18, 2022
Method of manufacturing a metal-oxide-semiconductor field-effect transistor (MOSFET) having low off-state capacitance due to reduction of off-state capacitance of back-end-of-line (BEOL) features of the MOSFET
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11398403B2Jul 26, 2022
Multiple thickness semiconductor-on-insulator field effect transistors and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11264456B2Mar 1, 2022
Isolation regions for reduced junction leakage
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11183570B2Nov 23, 2021
Structures and methods for noise isolation in semiconductor devices
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11171199B2Nov 9, 2021
Metal-insulator-metal capacitors with high breakdown voltage
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11145539B2Oct 12, 2021
Shallow trench isolation for integrated circuits
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11121141B2Sep 14, 2021
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10964589B2Mar 30, 2021
Semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12402389B2Aug 26, 2025
Semiconductor arrangement with airgap and method of forming
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12302637B2May 13, 2025
Semiconductor wafer with devices having different top layer thicknesses
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12009302B2Jun 11, 2024
Method of testing wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11348944B2May 31, 2022
Semiconductor wafer with devices having different top layer thicknesses
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10636870B2Apr 28, 2020
Isolation regions for reduced junction leakage
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10636695B2Apr 28, 2020
Negatively sloped isolation structures
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10522390B1Dec 31, 2019
Shallow trench isolation for integrated circuits
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10283510B2May 7, 2019
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9768182B2Sep 19, 2017
Semiconductor structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10672777B2Jun 2, 2020
Method of manufacturing semiconductor device having multi-height structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10535670B2Jan 14, 2020
Non-volatile memory having an erase gate formed between two floating gates with two word lines formed on other sides and a method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
Showing the top 50 of 57 patents by PatentIndex Score.