Inventor

SINGIDI HARISH

US26 patents

⚠️ This page may combine multiple inventors who share the name “SINGIDI HARISH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SINGIDI HARISH

MICRON TECHNOLOGY INC

Read voltage calibration based on host IO operations

Preemptive idle time read scans

Detecting power loss in NAND memory devices

Voltage degradation aware NAND array management

Tracking data temperatures of logical block addresses

Secure erase for data corruption

Block read count voltage adjustment

NAND temperature data management

Erase page check

Optimized scan interval

Managing partial superblocks in a NAND device

Correcting power loss in NAND memory devices

SLC page read

Block read count voltage adjustment

NAND cell encoding to improve data integrity

Implementing sticky read using error control success rate associated with a memory sub-system

Implementing sticky read using error control success rate associated with a memory sub-system

Dynamic error handling in a memory system

SANDISK TECHNOLOGIES LLC

Proxy wordline stress for read disturb detection

Systems and methods for retaining inflight data during a power loss event

Aggressive quick-pass multiphase programming for voltage distribution state separation in non-volatile memory

WESTERN DIGITAL TECH INC

Dynamic valley searching in solid state drives

Level dependent error correction code protection in multi-level non-volatile memory

Dynamic valley searching in solid state drives

SANDISK TECHNOLOGIES INC

Systems and methods for sampling data at a non-volatile memory system

Proxy wordline stress for read disturb detection