Inventor
ALSASUA GIANNI STEPHEN
US23 patents
Patents
23 patentsUS10691377B2Jun 23, 2020
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC6 citations84
US10672452B2Jun 2, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC7 citations84
US10366763B2Jul 30, 2019
Block read count voltage adjustment
MICRON TECHNOLOGY INC4 citations84
US11709633B2Jul 25, 2023
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC2 citations73
US11335394B2May 17, 2022
Temperature informed memory refresh
MICRON TECHNOLOGY INC1 citations73
US11269553B2Mar 8, 2022
Adjusting scan event thresholds to mitigate memory errors
MICRON TECHNOLOGY INC3 citations73
US11031089B2Jun 8, 2021
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US11023177B2Jun 1, 2021
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC1 citations73
US10998034B2May 4, 2021
Temperature informed memory refresh
MICRON TECHNOLOGY INC2 citations73
US10796745B2Oct 6, 2020
Temperature informed memory refresh
MICRON TECHNOLOGY INC2 citations73
US10755792B2Aug 25, 2020
Block read count voltage adjustment
MICRON TECHNOLOGY INC2 citations73
US10719271B2Jul 21, 2020
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC4 citations73
US10573357B2Feb 25, 2020
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10446197B2Oct 15, 2019
Optimized scan interval
MICRON TECHNOLOGY INC2 citations73
US10755793B2Aug 25, 2020
SLC page read
MICRON TECHNOLOGY INC2 citations71
US11934689B2Mar 19, 2024
Word line group read counters
MICRON TECHNOLOGY INC0 citations62
US11887651B2Jan 30, 2024
Temperature informed memory refresh
MICRON TECHNOLOGY INC0 citations62
US11688473B2Jun 27, 2023
SLC page read
MICRON TECHNOLOGY INC0 citations62
US11544008B2Jan 3, 2023
Temperature correction in memory sub-systems
MICRON TECHNOLOGY INC0 citations62
US11507300B2Nov 22, 2022
Word line group read counters
MICRON TECHNOLOGY INC1 citations62
US11456037B2Sep 27, 2022
Block read count voltage adjustment
MICRON TECHNOLOGY INC0 citations62
US11056156B2Jul 6, 2021
Optimized scan interval
MICRON TECHNOLOGY INC0 citations62
US11126495B2Sep 21, 2021
Dynamic error handling in a memory system
MICRON TECHNOLOGY INC0 citations52