Inventor

NELHIEBEL MICHAEL

AT18 patents

⚠️ This page may combine multiple inventors who share the name “NELHIEBEL MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NELHIEBEL MICHAEL

INFINEON TECHNOLOGIES AG

Compressive interlayer having a defined crack-stop edge extension

Current measuring circuit

Prognostic health management for power devices

Semiconductor device having a load current component and a sensor component

Semiconductor device including self-protecting current sensor

Electrically conductive element, power semiconductor device having an electrically conductive element and method of manufacturing a power semiconductor device

Semiconductor device with compressive interlayer

Semiconductor device having a copper element and method of forming a semiconductor device having a copper element

Barrier for power metallization in semiconductor devices

Apparatus and method for testing electric conductors

INFINEON TECHNOLOGIES AUSTRIA AG

Semiconductor device and a method of forming the semiconductor device

Semiconductor device power metallization layer with stress-relieving heat sink structure

Method of manufacturing a semiconductor device having a power metallization structure

Semiconductor device with copper structure

Self-organizing barrier layer disposed between a metallization layer and a semiconductor region

Power metallization structure for semiconductor devices

MATOY KURT

Integrated circuit including power transistor cells and a connecting line

DETZEL THOMAS

Integrated circuit and method of forming an integrated circuit